Previously, we demonstrated formation of hydroxyl radicals in the TiO2/Ti photoelectrocatalytic oxidation system by Fe(phen)32+ spectrophotometry. We showed that hydroxyl radicals exist in the as-prepared Pt–B/TiO2/Ti NTs.29 (link)
D8 advance
The D8 ADVANCE is a versatile X-ray diffractometer designed for a wide range of applications in materials science, chemistry, and geology. It features a high-performance goniometer, a powerful X-ray source, and advanced data acquisition and analysis capabilities. The D8 ADVANCE provides accurate and reliable measurements of crystalline structures, phase compositions, and other material properties.
Lab products found in correlation
3 protocols using d8 advance
Characterization of Pt-B/TiO2/Ti Nanostructures
Previously, we demonstrated formation of hydroxyl radicals in the TiO2/Ti photoelectrocatalytic oxidation system by Fe(phen)32+ spectrophotometry. We showed that hydroxyl radicals exist in the as-prepared Pt–B/TiO2/Ti NTs.29 (link)
Microcarrier Surface Characterization
Because of the size and geometry of microcarriers, the contact angle measurements on microcarries were made by relative measurements. PLGA, PLGA/HA and GO-PLGA/HA films were prepared and treated under similar conditions to the microcarriers. Static air–water contact angle measurements of the films were obtained using the sessile drop method on a contact angle system (VCA 2000, AST).
Characterization of FF-HP-β-CD via Analytical Techniques
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