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D8 advance

Manufactured by PerkinElmer
Sourced in Germany

The D8 ADVANCE is a versatile X-ray diffractometer designed for a wide range of applications in materials science, chemistry, and geology. It features a high-performance goniometer, a powerful X-ray source, and advanced data acquisition and analysis capabilities. The D8 ADVANCE provides accurate and reliable measurements of crystalline structures, phase compositions, and other material properties.

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3 protocols using d8 advance

1

Characterization of Pt-B/TiO2/Ti Nanostructures

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The crystalline phases of the samples were analyzed by X-ray diffraction (XRD; Bruker, EG). The surface morphologies of the samples were characterized by scanning electron microscopy (SEM; Hitachi, S-4300). X-ray photoelectron spectroscopy (XPS; PerkinElmer, D8 advance) with Mg Kα radiation was applied to determine the elemental compositions and valence states of the samples. Ultraviolet-visible diffuse reflectance spectroscopy (UV-vis DRS) were obtained on a UV-vis spectrophotometer (PerkinElmer; Lambda 950) and the photoluminescence (PL) spectra were recorded by a fluorescence spectrophotometer (PerkinElmer; Lambda 750). In addition, surface photovoltage spectroscopy (SPS) was applied to analyze the electronic transition of the samples on a SPS apparatus (Bofeilai; PL-SPS/IPCE1000).
Previously, we demonstrated formation of hydroxyl radicals in the TiO2/Ti photoelectrocatalytic oxidation system by Fe(phen)32+ spectrophotometry. We showed that hydroxyl radicals exist in the as-prepared Pt–B/TiO2/Ti NTs.29 (link)
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2

Microcarrier Surface Characterization

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The surface morphology and topography of the microcarriers was examined by a scanning electron microscope (SEM, XL 30 ESEM-FEG, FEI). The Fourier transform infrared spectroscopy (FT-IR, Perkin Elmer, FTIR-2000) and X-ray diffraction (XRD, D8 ADVANCE, Germany) were used to determine the chemical structure of the microcarriers.
Because of the size and geometry of microcarriers, the contact angle measurements on microcarries were made by relative measurements. PLGA, PLGA/HA and GO-PLGA/HA films were prepared and treated under similar conditions to the microcarriers. Static air–water contact angle measurements of the films were obtained using the sessile drop method on a contact angle system (VCA 2000, AST).
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3

Characterization of FF-HP-β-CD via Analytical Techniques

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The characterization of FF-HP-β-CD was studied via SEM (SU8020, Hitachi, Japan), DSC (METTLER TOLEDO, Switzerland), XRD (Bruker D8 Advance, Germany), FTIR (Spectrum Two, PerkinElmer, USA), and 1H-NMR (Bruker AV, Bruker, Germany).
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