Axs d8 focus x

Surface analyses were carried out using the following devices: a Bruker AXS D8 Focus X-ray diffractometer (Bruker AXS GmbH, Karlsruhe, Germany) with Cu Kα radiation, fitted with an iron fluorescence filter, in the range 20°–90°, at a rate of 8° min⁻¹ with a 0.02 passage. X-ray Mg/Al anode (CLAM 2) operating at 300W and at low pressures (< 10⁻⁸ Torr), whereas peaks were fitted with Gaussian-Lorentzian curves after subtracting the Sherly-type background using Leibol software (Homemade v. 2.0, CENIM, Madrid, Spain) and XPS (Fison Instruments, East Grinstead, UK). Hitachi S4800 Scanning Electron Microscope (Hitachi High-Technologies Corporation, Tokyo, Japan), operating at 15 kV and coupled to an EDX was used for the morphological observation.

The crystalline structures of the samples were characterized by X-Ray diffraction (XRD) on a Bruker AXS D8-Focus X-ray diffractometer with Cu-Kα (λ = 1.5405 Å) radiation. Morphologies of the samples were observed by scanning electron microscopy (SEM) with a Hitachi SU3500 scanning electron microscope. Brunauer-Emmett-Teller (BET) method (Micrometrics, ASAP 2460) was used to investigate the surface areas of the 4 kinds of conductors and the pore size distributions were determined by the Barret-Joyner-Halenda (BJH) method^{20 (link),21 (link)}.