To confirm specific cell binding, cultured cells were incubated with the protamine nanomedicine at a final concentration of 1.2 µg in 100 µL PBS at room temperature for 30 min. After washing twice with PBS, the treated cells were loaded on silicon slices and then fixed with 2.5% glutaraldehyde at 4 °C for two hours and examined by a scanning electron microscope (Nova NanoSEM 230, FEI Co., Hillsboro, OR, USA).
Nova nanosem 230
The Nova NanoSEM 230 is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis. It provides exceptional imaging capabilities with a resolution down to 0.8 nanometers. The system features a high-brightness field emission gun (FEG) source, advanced electron optics, and a range of detectors to enable comprehensive materials characterization.
Lab products found in correlation
191 protocols using nova nanosem 230
Nanoparticle Characterization by SEM
To confirm specific cell binding, cultured cells were incubated with the protamine nanomedicine at a final concentration of 1.2 µg in 100 µL PBS at room temperature for 30 min. After washing twice with PBS, the treated cells were loaded on silicon slices and then fixed with 2.5% glutaraldehyde at 4 °C for two hours and examined by a scanning electron microscope (Nova NanoSEM 230, FEI Co., Hillsboro, OR, USA).
Characterizing Hybrid Nanoparticle Morphology
Morphological Characterization of Apt-NMed
Characterizing Fibrous Membrane Surface
Characterization of Carbonized and Sulfurated ZIF-67
MgB2 Wire Characterization Protocol
Characterization of V2O5/Graphene Composites
Advanced Characterization of Material Samples
Hydrogel Ultrastructure Analysis via SEM
Structural Analysis of Nanohydroxyapatite and Hydrogels
of the obtained nanohydroxyapatite and lyophilized
hydrogels were determined using the X-ray powder diffraction (XRPD)
technique with a PANalytical X’Pert Pro diffractometer (Ni-filtered
Cu Kα radiation, V = 40 kV, I = 30 mA). The Fourier Transform infrared spectra (FT-IR) were detected
in KBr pellets at room temperature using a Thermo Scientific Nicolet
iS50 FT-IR spectrometer. The morphology of the obtained materials
and elemental analysis together with the mapping of elements were
done using a scanning electron microscope (SEM) FEI Nova NanoSEM 230
equipped with an energy dispersive X-ray spectrometer (EDS; EDAX PegasusXM4).
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