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Nova nanosem 230

Manufactured by Thermo Fisher Scientific
Sourced in United States, Netherlands, Czechia

The Nova NanoSEM 230 is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis. It provides exceptional imaging capabilities with a resolution down to 0.8 nanometers. The system features a high-brightness field emission gun (FEG) source, advanced electron optics, and a range of detectors to enable comprehensive materials characterization.

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191 protocols using nova nanosem 230

1

Nanoparticle Characterization by SEM

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To confirm the size and shape, fabricated nanoparticles were loaded on silicon slices and fixed with 2.5% glutaraldehyde (Sigma-Aldrich, St. Louis, MO, USA) at 4 °C for two hours, followed by sequential dehydration for 10 min each in 20%, 30%, 50%, 70%, 90%, and 100% ethanol. The fixed nanoparticles were sputter-coated with PtPd using a Cressington 208 HR Sputter Coater (Cressington Scientific, Cranberry Twp, PA, USA) and examined by a scanning electron microscope (Nova NanoSEM 230, FEI Co., Hillsboro, OR, USA).
To confirm specific cell binding, cultured cells were incubated with the protamine nanomedicine at a final concentration of 1.2 µg in 100 µL PBS at room temperature for 30 min. After washing twice with PBS, the treated cells were loaded on silicon slices and then fixed with 2.5% glutaraldehyde at 4 °C for two hours and examined by a scanning electron microscope (Nova NanoSEM 230, FEI Co., Hillsboro, OR, USA).
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2

Characterizing Hybrid Nanoparticle Morphology

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To discern the formation hybrid nanoparticles, Field Emission Scanning Electron Microscopy (FESEM) and Transmission Electron Microscopy (TEM) were employed. The best parameter of CNP° and CNP°-CGA were prepared as described earlier. The samples were placed on a stub and dried in incubator at 37 °C for two to three days. The samples were then coated with gold and viewed under Ultra High Resolution FESEM (Nova NanoSEM 230, FEI). The CNP° and CNP°-CGA images were then processed using ImageJ software to assess the particle size distribution. The size of CNP° and CNP°-CGA particles were measured, and a histogram bar on diameter and normal distribution curve were plotted. While, for TEM analysis, both the samples were immobilized on copper grids and air dried before examining under TEM (Tecnai TF20× -Twin, FEI) at MIMOS Berhad.
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3

Morphological Characterization of Apt-NMed

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Samples were studied by AFM and SEM to determine the size and morphology of freshly made Apt-NMed. For AFM imaging, prior to sample loading, the sample holder mica was pre-treated with 0.1 % (v/v) APTES (3-aminopropyltriethoxy-silane) water solution for 10 min, washed with pure water, and then dried with compressed nitrogen. The formed nanostructure Apt-NMed was diluted to 10 nM in Tris buffer supplemented with 10 mM MgCl2 in 10 μl; this solution was placed on a previously modified surface, absorbed for 5 min, washed with pure water, and dried with compressed nitrogen for imaging with MultiMode M8 AFM (Bruker, Spring, TX). For high-resolution images, an SNL-10 probe (Veeco Inc., USA), with super-sharp tips (2–3 nm radius), was used. For SEM imaging, a drop of solution (5 μl, 10 nM) was spotted onto silicon pre-treated with aminopropylsilane (APS) for 5 min to allow strong adsorption. The samples were air-dried and carefully mounted on an aluminum stub using either silver paint or a double stick carbon tape. Samples were then placed in the chamber of the sputter coater, and coated with a very thin film of gold. All SEM images were taken at 10–15 kV (accelerating voltage) with electron-beam spot size 3, in the FEI Nova NanoSEM 230 (Hillsboro, OR). Chamber pressure was between 1.0 × 10−7 and 1.0 × 10−6 mbar (1 mbar = 100 Pa).
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4

Characterizing Fibrous Membrane Surface

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The surface of fibrous membrane was first coated with gold via an electro-deposition method, and its surface morphology was then observed by a NOVA NANOSEM 230 (FEI, America) field emission scanning electron microscopy (FESEM) at an accelerating voltage of 15.0 kV.
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5

Characterization of Carbonized and Sulfurated ZIF-67

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The crystalline structure of carbonized and sulfurated ZIF-67 was characterized by an X-ray powder diffractometer (XRD, Bruker D8 ADVANCE, Cu Kα). Surface morphologies of the thin films were observed on a scanning electron microscope (SEM, FEI Nova Nano SEM 230, 15 kV). Electrochemical impedance spectroscopy (EIS) was measured in the darkness with a frequency response tracer (Solartron 1255B) and a potentiostat (Solartron SI 1287). The frequency range of EIS is 105–10−1 Hz. Both Tafel curves and cyclic voltammetry (CV) curves of CEs were measured on a potentiostat (Hokuto Denko HSV-100). A saturated calomel electrode as a reference and a Pt wire as a counter are placed in the cell. Tafel curves were measured at a constant scan rate of 10 mV s−1 and a sensitivity of 100 mV, and CV curves were measured at a scan rate of 5 mV s−1 and a sampling interval of 100 ms. Photocurrent–voltage (J–V) curves of the assembled QDSSCs were measured on a potentiostat (Hokuto Denko HSV-100). The active area of the cell was 0.2 cm2, which was illuminated with a solar simulator (Newport 94023A) under the simulated AM 1.5 sunlight (1 sun, 100 mW cm−2).
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6

MgB2 Wire Characterization Protocol

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The 36-filament MgB2 wire in the Nb barrier was manufactured using a continuous tube forming and filling (CTFF) process [9 (link)]. The fibers were produced from a mixture of boron nanopowder pre-doped with 2 at. % C, and magnesium with a Mg-to-B ratio of 1:2. The wires were pulled to a diameter of 0.83 mm, achieving a fill factor of 14%. Samples A and B were annealed at 700 °C for 15 min under low (0.1 MPa) and high (1 GPa) isostatic pressures, respectively [12 (link),13 (link)]. The transport critical current (Ic) of the MgB2 wires was measured by the four-probe resistive method at 4.2 K [13 (link),14 (link)]. The Ic was determined on the basis of a 1 V/cm criterion. The critical current density (Jc) was determined from the relationship Jc = Ic/S where S is the surface of the superconducting material. The critical temperature (Tc) and the critical magnetic fields (Birr and Bc2) were measured using the four-probe resistive method on a physical properties measurement system (PPMS). The Tc, Birr, and Bc2 were determined with the respective criteria of 50%, 10%, and 90% of the normal state resistance. Transport measurements were performed with the measurement error ranging from 2% to 4%. Analysis of the microstructure and composition was performed using scanning electron microscopy SEM; FEI Nova Nano SEM 230 (Hillsboro, OR, USA).
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7

Characterization of V2O5/Graphene Composites

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The crystal phases were collected using a Rigaku D/max2500 with Cu-Kα radiation (λ = 1.54178 Å) using a step of 0.02o between 10° and 80° (2θ). The morphologies of the samples were studied by scanning electron microscopy (SEM, FEI Nova Nano SEM 230) and transmission electron microscopy (TEM, FEI Tecnai G20). The X-ray diffraction (XRD) patterns of the samples were collected in the range between 10o and 80o with a step size of 0.02°. The weight percentages of graphene in the V2O5/graphene composites were determined by thermogravimetric (TG) analysis with a heating rate of 10 °C min−1. A spectrometer (Raman, LabRAM HR800) with a back-illuminated charge-coupled detector attachment was used to record the Raman spectra.
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8

Advanced Characterization of Material Samples

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Powder X-ray diffraction (XRD) patterns were used to determine the crystal structures of the samples over a range of 20°–70°, using an XRD-6000 diffractometer (Shimadzu, Tokyo, Japan) with CuKα radiation (λ 1.5406 Å) at 30 kV and 30 mA. Fourier transform infrared (FTIR) spectra of the materials were recorded over a range of 400–4,000 cm−1, using a Nexus, Smart Orbit spectrometer (Thermo Fisher-Scientific, Waltham, MA, USA) and the KBr disk method. Thermogravimetric analyses (TGAs) were performed using a Mettler-Toledo 851e instrument (Mettler-Toledo, Columbus, OH, USA), with a heating rate of 10°C/minute in 150 μL alumina crucibles over a range of 30°C–900°C. A CHNS-932 (Leco, St Joseph, MI, USA) instrument was used to analyze carbon, hydrogen, nitrogen, and sulfur. A NOVA™ NanoSEM 230 (FEI, Hillsboro, OR, USA) scanning electron microscope (SEM) was used to observe the surface morphologies of the samples. The magnetic properties were evaluated using a Lake Shore 7404 vibrating sample magnetometer (Lake Shore Cryotronics, Inc., Westerville, OH, USA). Ultraviolet-visible spectra were generated both to determine the optical properties and for controlled release studies, using an ultraviolet-visible spectrophotometer (PerkinElmer).
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9

Hydrogel Ultrastructure Analysis via SEM

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The hydrogel samples were prepared as described in the compression tests. After 24 h in PBS, the samples were fixed with glutaraldehyde (2.5% diluted in 0.1 M PBS, pH 7.4, G6257, Sigma-Aldrich, USA) for 2 h. The samples were then dehydrated by immersion in graded ethanol solutions in Milli-Q water: 50% (once for 10 min), 70% (twice for 10 min), 90% (thrice for 10 min), 96% (thrice for 10 min), and 100% (thrice for 10 min). The samples were then placed in a critical point dryer (Leica EM CPD300, Austria) and imaged using ultrahigh-resolution scanning electron microscopy (Nova NanoSEM 230, FEI Company, Netherlands). On hydrogels with cells, the samples were fixed and dehydrated at the respective time points using the same protocol, followed by critical point drying and imaging.
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10

Structural Analysis of Nanohydroxyapatite and Hydrogels

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The structure
of the obtained nanohydroxyapatite and lyophilized
hydrogels were determined using the X-ray powder diffraction (XRPD)
technique with a PANalytical X’Pert Pro diffractometer (Ni-filtered
Cu Kα radiation, V = 40 kV, I = 30 mA). The Fourier Transform infrared spectra (FT-IR) were detected
in KBr pellets at room temperature using a Thermo Scientific Nicolet
iS50 FT-IR spectrometer. The morphology of the obtained materials
and elemental analysis together with the mapping of elements were
done using a scanning electron microscope (SEM) FEI Nova NanoSEM 230
equipped with an energy dispersive X-ray spectrometer (EDS; EDAX PegasusXM4).
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