The substrates with and without cells grown were sputter-coated with a gold layer of ~10 nm thick by using a Denton Vacuum Desk V sputter unit (Denton Vacuum, LLC, Moorestown, NJ, USA), and imaged in a JEOL JSM-7600F SEM.
Jsm 7600f sem
The JSM-7600F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It provides high-resolution imaging and analysis capabilities for a wide range of materials and applications. The JSM-7600F's core function is to generate and detect electron signals, which are then used to create detailed images of the sample surface.
Lab products found in correlation
17 protocols using jsm 7600f sem
SEM Imaging of Cell-Grown Substrates
Comprehensive Characterization of MoS2 Nanosheets
Exosome and Vesicle Characterization by SEM
Comprehensive Characterization of Nanostructured Materials
Characterization of G/SA Sponges
Lyophilization and SEM Analysis of Phytosomes
Scanning Electron Microscopy Preparation of Plant Buds
Synthesis and Characterization of Silver Nanoparticles in Cellulose
Antibacterial Nanocomposite Evaluation
Scanning Electron Microscopy of Cells
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!