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Picoplus afm

Manufactured by Agilent Technologies
Sourced in United States

The PicoPlus AFM is an atomic force microscope (AFM) manufactured by Agilent Technologies. It is designed to provide high-resolution imaging and surface analysis capabilities for a variety of applications. The core function of the PicoPlus AFM is to measure and analyze the topography and physical properties of surfaces at the nanoscale level.

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4 protocols using picoplus afm

1

Measuring Cellular Biomechanics with AFM

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Cells were detected by a contact mode PicoPlus AFM controlled by Picoview software (Agilent Technologies). Biomechanical properties were calculated from in situ force–distance curve measurements in medium at room temperature. The radius of silicon nitride tips was 20 nm. Its spring constant was calibrated to 0.10–0.11 N m−1 by Thermo K Calibration (Agilent Technologies) and its corresponding deflection sensitivities were 45–50 nm V−1. More than 10 cells were detected, collecting at least 15 force curves on the central area of different cells to avoid spurious detections.25 (link),26 (link) Scanning Probe Image Processor (SPIP) software (Image Metrology) was used to calculate Young’s modulus and adhesion force by fitting the Sneddon variation of Hertz model.27 –29 (link) The half cone-opening angle of tip was 36°, and cellular Poisson’s ratio was 0.5. The detection was accomplished within 2 hours (h) to approximate physiological conditions.
Ecell = 4FZ)(1 − ηcell2)/3(ΔZ1.5)tan θ, where Ecell: Young’s modulus; F: loading force; ηcell: Poisson ratio; ΔZ: indentation; θ: tip half cone opening angle.
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2

Adsorption and AFM Imaging of DCN

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DCN (2 μL, 20 nM) was deposited onto a freshly cleaved mica cell and left to adsorb for 2–3 min. 1×TAE-Mg2+ buffer (400 μL) was added to the liquid cell, and the sample was scanned in a tapping mode under fluid on a Pico-Plus AFM (Agilent Technologies, Santa Clara, CA, USA) with NP-S tips (Veeco, Inc., Oyster Bay, NY, USA).
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3

Measuring Nanomechanical Properties of Lipid Bilayers

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Force measurements were performed on a PicoPlus AFM (Agilent Technologies) operated under PicoView 1.6.8 (Agilent Technologies). Force distance cycles were acquired using silicon cantilevers with a spring constant of 0.01 N/m or 0.6 N/m (Veeco) at pulling velocities of 0.14–1.33 µm/sec. Commercially available silicon-nitride AFM cantilevers with silicon tips (MSNL-10) were amine-functionalized as described in Tip- and Surface-Chemistry.
The effective spring constant was determined via thermal noise analysis38 . For Fig. 3 we show the tip-support separation Δz of an AFM tip indenting into a supported DOPC bilayer. The distance of the tip from the surface of the mica-support was calculated from Δz=zz0F/kS , where F denotes the force and z the cantilever position recorded during the approach curve, k the effective spring constant of the cantilever, and S the sensitivity taken from the approach curve upon bilayer penetration. The position of the mica surface z0 was determined from the plateau regions observable in Fig. 3 at high forces, equivalent to full penetration of the tip through the bilayer.
F was plotted versus Δz for multiple approach curves, which allows for extracting the thickness of the elastically deformed fluid bilayer, 2d, by fitting with Equation 139 (link): F=πκAR4(2(2dΔz)Δz)2
κA denotes the membrane compressibility and R the tip radius.
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4

Adsorption and AFM Imaging of DTN

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DTN (2 μL, 20 nM) was deposited onto a freshly cleaved mica cell and left to adsorb for 2–3 min. 1 × TAE-Mg2+ buffer (400 μL) was added to the liquid cell, and the sample was scanned in a tapping mode under fluid on a Pico-Plus AFM (Agilent Technologies, Santa Clara, CA, USA) with NP-S tips (Veeco, Inc., Oyster Bay, NY, USA).
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