Ecell = 4F(ΔZ)(1 − ηcell2)/3(ΔZ1.5)tan θ, where Ecell: Young’s modulus; F: loading force; ηcell: Poisson ratio; ΔZ: indentation; θ: tip half cone opening angle.
Picoplus afm
The PicoPlus AFM is an atomic force microscope (AFM) manufactured by Agilent Technologies. It is designed to provide high-resolution imaging and surface analysis capabilities for a variety of applications. The core function of the PicoPlus AFM is to measure and analyze the topography and physical properties of surfaces at the nanoscale level.
Lab products found in correlation
4 protocols using picoplus afm
Measuring Cellular Biomechanics with AFM
Adsorption and AFM Imaging of DCN
Measuring Nanomechanical Properties of Lipid Bilayers
The effective spring constant was determined via thermal noise analysis38 . For Fig.
F was plotted versus Δz for multiple approach curves, which allows for extracting the thickness of the elastically deformed fluid bilayer, 2d, by fitting with Equation
κA denotes the membrane compressibility and R the tip radius.
Adsorption and AFM Imaging of DTN
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