Oxford diffractometer
The Oxford diffractometer is a laboratory instrument designed for the analysis of crystalline materials. Its core function is to perform X-ray diffraction, a technique used to determine the atomic and molecular structure of a wide range of crystalline substances.
Lab products found in correlation
9 protocols using oxford diffractometer
Single-Crystal X-Ray Structural Analysis of Cu2+-L Complex
Polymorph Screening and Structural Characterization
The crystallographic data of all crystal forms were collected on a Rigaku Oxford diffractometer at ambient temperatures, except for 1-I, for which data collection was carried out on a Bruker APEX-II diffractometer with a CuKα radiation (λ = 1.54184 Å). Cell refinement and data reduction were performed using CrysAlisPro. Structure solution and refinement were carried out using the SHELXT37 and SHELXL38 (link) programs, respectively. PXRD data for the crystal forms were collected on a Rigaku X-ray diffractometer with CuKα radiation (40 kV, 15 mA, λ = 1.5406 Å) between 5.0 and 50.0° (2θ) at ambient temperatures.
DSC experiments were performed on SII instruments DSC6220 (Seiko Instruments Inc., Japan). TGA experiments were run on SDT Q600 (TA Instruments, USA). Tzero® pans and aluminum hermetic lids were used for measuring a few milligrams of a finely ground sample, at a heating rate of 10 °C min−1.
Characterization of Organic Compounds by Spectroscopic Methods
Lanthanide Complex Structural Analyses
Structural Characterization of Halogenated Organic Acids
Structural Analysis of [3.2.1‐abco]ReO4
Rigaku Oxford Diffractometer Crystallographic Analysis
Characterization of Crystalline Solvent Association
1H NMR, DSC, and TGA were employed to confirm the association of solvent with CLX. 1H NMR spectrum was recorded on a Premium Shielded spectrometer (USA) in DMSO-d6. Thermal analyses were performed on SII instruments DSC6220 (Japan). Tzero pans and aluminum hermetic lids were used for measuring, in general, a few milligrams of samples. A heating rate of 10 °C min−1 was employed. Thermogravimetric analysis (TGA) tests were carried out on SDT Q600 of TA Instrument (USA) with a few milligrams of ground sample placed in an open aluminum pan and a heating rate of 10 °C min−1 applied under N2 atmosphere.
Crystallographic data for CLX·DMA were collected at 293(2) K on a Rigaku Oxford diffractometer using a CuKα radiation (λ = 1.54184 Å). Cell refinement and data reduction were done using CrysAlisPro. Structure solution and refinement were carried out using the SHELXS and SHELXL programs, respectively.
PXRD data for the solvate and desolvated sample were collected on a Rigaku X-ray diffractometer with CuKα radiation (40 kV, 15 mA, λ = 1.5406 Å) between 5.0–50.0° (2θ) at ambient temperatures.
Single-crystal X-ray Diffraction Analysis
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