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9 protocols using oxford diffractometer

1

Single-Crystal X-Ray Structural Analysis of Cu2+-L Complex

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CIF table, selected bond lengths and bond angles of the Cu2+–L complex are given in Tables 2, S1 and S2, respectively. Single-crystal X-ray data were collected using a Rigaku Oxford diffractometer with graphite-monochromated Cu-Kα (λ = 1.54178 Å) radiation at 110(2) K. The “Bruker Saint Plus” program39 was used for data reduction. Data were corrected for Lorentz and polarization effects; an empirical absorption correction (SADABS) was applied.39 The structure was solved by direct methods with SIR-97 and refined by full-matrix least squares methods based on F2 by using SHELXL-97,40 (link) incorporated in the WinGX 2014.1 crystallographic package.41 (link) All nonhydrogen atoms were refined with anisotropic thermal parameters. The positions of the hydrogen atoms were calculated assuming ideal geometries, but were not refined.
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2

Polymorph Screening and Structural Characterization

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Slow evaporation in a variety of commonly used solvents (ranging from apolar to polar aprotic and polar protic) was employed for polymorph screening for all eight compounds,36 and high-quality single crystals were used for structure determination by SCXRD. The identity of individual batches of crystals was determined by PXRD.
The crystallographic data of all crystal forms were collected on a Rigaku Oxford diffractometer at ambient temperatures, except for 1-I, for which data collection was carried out on a Bruker APEX-II diffractometer with a CuKα radiation (λ = 1.54184 Å). Cell refinement and data reduction were performed using CrysAlisPro. Structure solution and refinement were carried out using the SHELXT37 and SHELXL38 (link) programs, respectively. PXRD data for the crystal forms were collected on a Rigaku X-ray diffractometer with CuKα radiation (40 kV, 15 mA, λ = 1.5406 Å) between 5.0 and 50.0° (2θ) at ambient temperatures.
DSC experiments were performed on SII instruments DSC6220 (Seiko Instruments Inc., Japan). TGA experiments were run on SDT Q600 (TA Instruments, USA). Tzero® pans and aluminum hermetic lids were used for measuring a few milligrams of a finely ground sample, at a heating rate of 10 °C min−1.
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3

Characterization of Organic Compounds by Spectroscopic Methods

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All solvents (analytical grade and spectroscopic grade) were obtained from Finar (India) and Spectrochem (India) and the solvents were purified using standard literature methods. Deuterated solvents for NMR were bought from Sigma-Aldrich (India) and used as received. All metal salts and other chemicals were obtained from Alfa-Aesar (India), Spectrochem (India) and Merck (India). Melting points were measured using a BUCHI M-500 instrument. Fourier transform infrared (FT-IR) spectra were recorded on a BRUKER ALPHA-T FT-IR spectrometer using KBr pellets. A PerkinElmer model Lambda 650 UV-vis spectrophotometer was used for recording the absorption spectra. Emission spectra were recorded on a Fluoromax 4P Spectro-fluorometer (Horiba-Jobin-Mayer, Edison, NJ, USA). The bioimaging experiments were carried out using a Leica TCS SP5 confocal microscope and the fluorescence lifetime was measured using a time-correlated single-photon counting (TCSPC) spectrometer (Edinburgh, OB920) instrument. 1H and 13C NMR spectra were recorded on a Bruker AVANCE 400 NMR spectrometer. A Bruker microTOF-Q II mass spectrometer was used for electrospray ionization mass spectrometry (ESI-MS) analysis of the compounds. X-ray data were collected using a Rigaku Oxford diffractometer with graphite-monochromated Cu-Kα (λ = 1.54178 Å) radiation at 110(2) K.
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4

Lanthanide Complex Structural Analyses

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Elemental analyses (C, H, and N) were performed using a vario EL (Elementar Analysensysteme GmbH Co.). 1H-NMR spectra were collected on a JEOL JNM-ECP 500. UV spectra and luminescence spectra were recorded on a Shimadzu UV-3600S and a Horiba Jobin Yvon Fluorolog 3-22, respectively. Absolute luminescence quantum yield values were measured using a Hamamatsu Photonics K.K. C9920-02 for the UV-vis wavelength region and C13534 for NIR. Structural analyses of a series of LnL complexes were performed using a Rigaku Synergy S and XtaLAB mini II, Rigaku Oxford diffractometer with Mo Kα radiation (λ = 0.71073 Å). The structures were solved by direct methods and refined on F2 by a full-matrix least-squares method using the SHELXTL-97 program: CCDC 2144933 (at 90 K) and 2144934 (at 300 K) for EuL, 2144935 for GdL, 2144936 for TbL, 2144931 for NdL, 2144932 for SmL, 2144937 for DyL, and 2144938 for YbL. Synchrotron X-ray diffraction data were collected at the beam line BL02B2 (λ = 0.998983 Å) in SPring-8. The sample was held in a glass capillary (Markröhrchenaus Glas, 0.3 mm, Hilgenberg Co.)
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5

Structural Characterization of Halogenated Organic Acids

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The single‐crystal X‐ray diffraction data of Cl‐OA, Br‐OA, mono‐I‐OA and orth‐I‐OA were collected at 298 K on the Rigaku Oxford diffractometer (Cu Kα, λ = 1.54184 Å). The structures were determined and refined by the direct methods with the full‐matrix least‐squares method based on F2 in the SHELXTL program package. All the non‐H atoms were anisotropically refined using all reflections with I(I). The asymmetric unit and packing images were drawn by the DIAMOND. Variable‐temperature PXRD measurements were performed on a Rigaku D/MAX 2000 PC X‐ray diffractometer in the 2θ range of 5 to 50° with a step size of 0.02°. The infrared spectra were obtained on a Fourier Transform Infrared spectrometer (EQUINOX 55, Bruker, Germany). The samples were prepared by grinding the dried powder of mono‐ and orth‐I‐OA with KBr together, and then compressed into thin pellets. The 1H nuclear magnetic resonance spectroscopy measurement was performed on the Bruker AVANCE NEO 300 MHz NMR spectrometer with 2 mg of the samples dissolved in 0.75 mL deuterated chloroform solvent.
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6

Structural Analysis of [3.2.1‐abco]ReO4

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The single‐crystal diffraction data of [3.2.1‐abco]ReO4 at 373, 300, 253, and 100 K by using Rigaku Oxford diffractometer with Cu‐Kα radiation (λ = 1.54178 Å) was obtained. The structures by direct methods and refined them by the full‐matrix method based on the SHELXTL software package was solved. The C, N, Re, and O atoms were refined anisotropically. The X‐ray crystallographic structures have been deposited at the Cambridge Crystallographic Data Centre (deposition numbers CCDC 2252194–2252197) and can be obtained free of charge from the CCDC via www.ccdc.cam.ac.uk/getstructures. Powder X‐ray diffraction (PXRD) patterns were collected by using a Rigaku Smartlab X‐ray diffraction system with Cu Kα radiation. For PXRD patterns, the recorded 2θ angles range is 5–50°, and the step size was 0.02°.
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7

Rigaku Oxford Diffractometer Crystallographic Analysis

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All single-crystal measurements were performed on a Rigaku Oxford diffractometer (Rigaku, Co. Tokyo, Japan) using CuKα (λ = 1.54056 Å) radiation. The structures were solved by direct methods (SHELXTL-2014) and refined by full-matrix least-squares on F2. Crystallographic data in standard CIF format were deposited with the Cambridge Crystallographic Data Centre. The CCDC numbers are shown in Table 3. Copies of the data can be obtained, free of charge, on application to CCDC, 12 Union Road, Cambridge CB2 1EZ, U.K. (fax: (+44)1223-336033; e-mail: deposit@ccdc.cam.ac.uk).
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8

Characterization of Crystalline Solvent Association

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1H NMR, DSC, and TGA were employed to confirm the association of solvent with CLX. 1H NMR spectrum was recorded on a Premium Shielded spectrometer (USA) in DMSO-d6. Thermal analyses were performed on SII instruments DSC6220 (Japan). Tzero pans and aluminum hermetic lids were used for measuring, in general, a few milligrams of samples. A heating rate of 10 °C min−1 was employed. Thermogravimetric analysis (TGA) tests were carried out on SDT Q600 of TA Instrument (USA) with a few milligrams of ground sample placed in an open aluminum pan and a heating rate of 10 °C min−1 applied under N2 atmosphere.
Crystallographic data for CLX·DMA were collected at 293(2) K on a Rigaku Oxford diffractometer using a CuKα radiation (λ = 1.54184 Å). Cell refinement and data reduction were done using CrysAlisPro. Structure solution and refinement were carried out using the SHELXS and SHELXL programs, respectively.
PXRD data for the solvate and desolvated sample were collected on a Rigaku X-ray diffractometer with CuKα radiation (40 kV, 15 mA, λ = 1.5406 Å) between 5.0–50.0° (2θ) at ambient temperatures.
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9

Single-crystal X-ray Diffraction Analysis

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Suitable single crystals for 1–3 were selected for single-crystal X-ray diffraction analysis. Data were collected using a Rigaku Oxford diffractometer with a Mo–Kα radiation (λ = 0.71073 Å) at 120 K. The structures were solved by direct methods and refined by least-squares on F2 utilizing the SHELXTL program suite and Olex2 (Dolomanov et al., 2009 (link); Sheldrick, 2015a (link),b (link)). The hydrogen atoms were set in calculated positions and refined as riding atoms with common fixed isotropic thermal parameters. EA was used to detect the content of C, H, and N atoms. Detailed information about the crystal data and structure refinements is summarized in Table 1. Selected bond lengths and angles of complexes 1–3 are listed in Supplementary Table S1–S3.
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