N5230c network analyzer

The crystal structures of the products were identified using an X-ray diffractometer (XRD) with Cu Kα radiation (Rigaku D/MAXRC). Raman spectra were recorded with a confocal Raman spectrometer system (In Via, Renishaw, Gloucestershire, UK) at an excitation wavelength of 514.5 nm. The accuracy of the Raman and XRD measurements was 5%. The samples used for complex permittivity and permeability measurements were prepared by dispersing composites into paraffin at a mass fraction of 20%. The obtained sample was subsequently pressed into a ring (outer diameter (D_outer) = 7.0 mm and inner diameter (D_in) = 3.04 mm). The electromagnetic parameters of the samples from 2 to 18 GHz were measured in accordance with standard SJ-20512-1995 (test methods for permittivity and permeability of micowave high-loss solid materials) using an Agilent N5230C network analyzer. The test error was less than 10%.

The crystal structure of the samples was analyzed using X-ray diffractometer (XRD, Rigaku D/MAX-2500) with a Cu K_a irradiation (λ = 1.54178 Å, 40.0 kV, 150.0 mA), recorded from 5° to 90° (2θ) with a scanning step of 6°/min. Transmission electron microscopy (TEM, JEOL-2100) was used to observe the morphology, size and microstructure of the samples. Room-temperature magnetic properties of the samples were measured by a Riken vibrating sample magnetometer. The complex permittivity and permeability parameters of the composites were measured using an Agilent N5230C network analyzer in the range of 2.0–18.0 GHz, for which the samples containing 50 wt.% obtained composites and 50 wt.% wax were pressed into toroidal shapes (Φ_out = 7.00 mm and Φ_in = 3.04 mm).