Sigma 300 field emission scanning electron microscope
The Sigma 300 field emission scanning electron microscope is a high-performance imaging and analysis instrument. It utilizes a field emission electron source to produce a fine, high-intensity electron beam. The microscope is designed to provide high-resolution imaging and analytical capabilities for a wide range of sample types and applications.
8 protocols using sigma 300 field emission scanning electron microscope
Biostimulated Mineralization of Calcareous Sand
Scanning electron microscopy of rat brain ventricles
Hydrogel Surface Characterization Protocol
Characterization of MoS2 and MoO3 Films
300 field emission scanning electron microscope was used to investigate
the morphological characteristics of MoS2 and MoO3 films. A WITech alpha 300R was used for micro-Raman measurements
of MoS2, MoS2/MoO3, and MoO3 films. For crystal structure characterization of films, a PANalytical
Empyrean X-ray diffraction (XRD) system was used. X-ray photoelectron
spectroscopy (XPS) measurements for determining the material composition
were performed with a Specs Flex-Mod XPS system equipped with a 150
mm radius hemispherical energy analyzer with a 2D charge-coupled detector.
The measurements were performed using an Al anode with a Kα energy of 1486.71 eV. The depth profile measurements were conducted
by 3 keV Ar+ ion sputtering with 300 s of etching for each
cycle.
Scanning Electron Microscopy of Organoids
Examination of Vitrified Tissue Surfaces
Characterizing Crosslinked Scaffold Pores
Nanoparticle Characterization by SEM and TEM
a Sigma 300 field emission scanning electron microscope, Ziess, fitted
with in-lens SE, SE (secondary electron), and BS (backscatter electron)
detectors. The samples are loaded on a carbon tape, and the data are
analyzed using SmartSEM software. High-resolution transmission electron
microscopy (HRTEM) images are recorded using JEOL and JEM 2100 to
confirm the size, morphology and crystallinity of the nanoparticles,
and energy-dispersive X-ray spectroscopy (EDX) mapping is done to
assess the composition of the samples. The samples are prepared using
the drop cast method on a copper-coated carbon grid and dried in an
oven at 60 °C.
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