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Sigma 500vp analytical fe sem

Manufactured by Zeiss
Sourced in Germany

The Zeiss Sigma 500VP Analytical FE-SEM is a field emission scanning electron microscope. It is designed for high-resolution imaging and elemental analysis of a wide range of materials.

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2 protocols using sigma 500vp analytical fe sem

1

Comprehensive Physicochemical Characterization of CFN

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X-ray diffraction analysis was carried out to confirm phase formation and crystalline phases existing in the sample using an X-ray diffractometer (analytical-x’ pertpro, Cukα1 radiation, λ = 1.5404 Å, 45 kV, 40 mA, Netherlands). The results were collected in the 2-theta range 20° ≤ 2θ ≤ 70° with a step size =0.02° with an irradiation time of 0.5 s/ step. Additionally, the particle size was calculated using Scherrer equation [24 ]. Fourier transform infrared (FTIR) studies were performed in order to assure the phase purity and the nature of chemical bonds formed in CFN using FTIR (Thermo Fisher Scientific Inc., Pittsburgh, PA, USA). Furthermore, the mean hydrodynamic particle size measured by dynamic light scattering (DLS) and the zeta potential of CFN that correlated to the magnitude of the electrical charge at the particle surface and molecular weight of large polymeric substances dispersed in water were measured using Nano-Zetasizer 3000 HS (Malvern Instruments, Malvern, UK). Field emission scanning electron microscope was imaged for the powdered sample using Zeiss Sigma 500VP Analytical FE-SEM, Carl Zeiss (Germany) using accelerating voltage up to 30kV.
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2

Characterization of CUR-loaded PLGA NPs

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The surface morphology of CUR-loaded PLGA NPs was investigated with a scanning electron microscope (Zeiss Sigma 500 VP Analytical FE-SEM, Carl Zeiss Germany) and X-ray diffraction (XRD) analysis (model no: 202964, Pananlytical Empyrean company). In addition, their zeta potential and size were detected by Malvern (Malvern Instruments Ltd) following the method by Moaty et al. [18 (link)].
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