TEM analysis (transmission electron microscopy) was conducted to inspect the morphology of the nanoemulsion and nanogel. One drop of each was poured on a 200-meshcarbon-coated copper grid and utilized in a TEM device (Philips EM208S 100 KV, Max Res 0.2 nm, Netherlands).
Em208s 100kv
Manufactured by Philips
Sourced in Netherlands, United States, Japan, Cyprus
The EM208S 100KV is a high-voltage electron microscope. It is designed to operate at an accelerating voltage of 100 kilovolts, enabling it to provide high-resolution imaging of samples. The EM208S is a product of Philips, a leading manufacturer of scientific instrumentation.
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Lab products found in correlation
Nmr spectrometer, by Bruker (1 mentions)
Dtg 60, by Shimadzu (1 mentions)
X pert mpd diffractometer, by Philips (1 mentions)
Ft ir 4100 spectrophotometer, by Jasco (1 mentions)
Uv 2100 spectrometer, by Shimadzu (1 mentions)
Nicolet is10, by Thermo Fisher Scientific (1 mentions)
Asap 2020, by Micromeritics (1 mentions)
Elexsys 500 spectrometer, by Bruker (1 mentions)
Ftir1650 spectrophotometer, by Shimadzu (1 mentions)
Amicus, by Shimadzu (1 mentions)
Uv 2550, by Shimadzu (1 mentions)
Miniflex 600, by Rigaku (1 mentions)
Ftir 460 spectrometer, by Jasco (1 mentions)
Lambda 25, by PerkinElmer (1 mentions)
Hydrophilic silica nanoparticles, by Merck Group (1 mentions)
9 protocols using em208s 100kv
1
Nanomaterial Morphology Characterization
2
Synthesis and Characterization of Nanocatalysts
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All consumable reactants were provided by Merck/Aldrich and utilized as received. Infrared spectra were conducted as KBr pellets utilizing a Nexus 670 spectrometer. TGA is collected using a Shimadzu DTG60 apparatus. Nanocatalysts' morphology and energy-dispersive X-ray spectroscopy (EDS) were scrutinized using FESEM-Tescan MIRA. The 13C (75 MHz) and 1H (300 MHz) NMR spectra, were obtained on Bruker NMR-Spectrometer. Vibrating-sample magnetometry (VSM) measurements were carried out using a SQUID magnetometer. X-ray diffraction (XRD) spectrum was provided by an X'PertPro. TEM was obtained using Philips EM208S 100kV. ICP was employed to find the percentage of Ni.
3
Characterization of Synthesized Nanomaterials
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All reagents were purchased from commercial suppliers (Merck and Aldrich) and used without further purification. The FT-IR spectra of products were measured in ATR approach by JASCO FTIR-4100 spectrophotometer. The X-ray diffraction (XRD) patterns were recorded by using a Philips Xpert MPD diffractometer with Cu Ka radiation (l = 0.15418 nm). Transmission Electron Microscopy (TEM) was carried out on Philips EM 208S 100KV. Scanning electron microscopy (FE-SEM) images were obtained using a Mira 3-XMU instrument. The UV-vis spectra were recorded on a Shimadzu UV-2100 spectrometer.
4
Multi-Technique Characterization of HGO
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FTIR spectroscopy was performed by Thermo scientific model Nicolet iS10. Field emission scanning electron microscopy (FESEM) and X-ray diffraction spectroscopy (EDX) was done by MIRA3 from TSCAN Company. Brunauer Emmett Teller’s (BET) experiment was performed using a Belsorp mini II from Microtrac Bel Corp. The weight of HGO for BET analysis was 0.0586 and 0.0547 g. Impedance Tube was utilized from Manufacturer of BSWA Technology Company Model: BSWA, SW477 + SW422. Raman spectroscopy was performed using Handheld Raman Analyzer (Firstguard) from Rigaku by an exciting wavelength of 1064 nm. Thermogravimetric analysis (TGA) was done by TGA-DTA (Q600) from TA Company, and Transmission Electron Microscopy (TEM) images were recorded by Philips EM208S 100 kV.
5
Comprehensive Characterization of Porous Carbon
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Micromeritics ASAP2020 (US) adsorption analyzers was employed to measure the N2 adsorption–desorption isotherms at 77 K. Before performing the adsorption–desorption analyses, samples were degassed under dynamic vacuum conditions to constant weight at a temperature of 393 K for 2 h. Raman spectroscopy was conducted on a Takram micro-Raman spectrometer (Teksan™, Iran). FTIR spectroscopy was accomplished on a PerkinElmer Spectrometer in the range of 500–4000 cm−1 with KBr pallets. X-ray photoelectron spectroscopy (XPS) measurements were carried out on an Al Kα source (XPS Spectrometer Kratos AXIS Supra). Transmission electron microscope (TEM) using Philips EM208S 100 kV. Thermogravimetric analyses (TG) in argon and air atmosphere were conducted on a Q600 (US) TA. Field emission scanning electron microscopy (FESEM) was observed on a Nanosem-450 microscope. Low-pressure CO2 adsorption isotherms of the synthesized porous carbon were measured at 273 K on an ASAP 2020 (US) Micromeritics at 0–1 bar.
6
Characterization of TiO2/β-Bi2O3 Nanocomposite
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The crystal structure of the TiO2/β-Bi2O3 nanocomposite synthesized by the Rigaku MiniFlex 600 (XRD) radiation diffract meter was investigated using Cu Ka radiation as the X-ray source. Fourier transform infrared (FTIR) spectroscopy (Shimadzu, FTIR 1650 spectrophotometer, Japan) were also applied to determine the chemical features of the nanocomposite. X-ray photoelectron (XPS) spectroscopy was performed using AMICUS, Kratos Analytical (Shimadzu) spectroscopy to investigate the oxidation state and chemical environment of the elements in the sample. The morphology and morphology of the samples were studied by a field diffusion scanning electron microscope (FESEM; JEOLJSM-7600F) equipped with an energy scattering spectrometer (EDS). The detailed study of the structure and size of nanoparticles was performed using TEM analysis (Philips EM208S 100KV). Nanocomposite topography was determined using atomic force microscopy (AFM). Ultraviolet reflection spectrum (DRS) was recorded on UV–Vis spectroscopy (Shimadzu, UV-2550, Japan). The Brunauer-Emmett-Teller (BET) surface area and sample pore size distribution were studied in the N2 adsorption analyzer (NOVA 2000e) the USA. Active free radicals were determined using electron paramagnetic resonance (EPR) in a Bruker ELEXSYS 500 spectrometer.
7
Characterization of Magnetic Nanocomposites
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Bruker diffractometers (PW1730) were used to carry out X-ray diffraction (XRD) with Cu Kα radiation (λ = 1.5406 Å). In order to characterize the morphology of the samples, transmission electron microscopes (TEM, Philips EM208S 100 KV) and field emission scanning electron microscopes (FESEMs, Hitachi, Japan) were used. To measure absorbance from 200 to 800 nm, Uv/Vis spectrometer (Perkin Elmer Lambda 25) was used. In addition, a JASCO FT-IR-460 spectrometer was utilized to obtain Fourier transform infrared spectroscopy (FT-IR) in the 400 to 4,000 cm−1 range. Using vibrating sample magnetometers (VSM), magnetic nanocomposites were measured at Mahamax, Tehran, Iran).
8
Silica Nanoparticles for Carbonate Reservoir Flooding
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Hydrophilic silica nanoparticles (non-porous, 25 nm, the specific surface area of 200 m2/g, the density of 2.4 g/cm3, and purity +99.5%), which were purchased from Sigma-Aldrich Company, Taufkirchen, Germany were used in experiments. Transmission electron microscopy (TEM) analysis on the silica powders was performed using a transmission electron microscope (Model: Philips EM208S 100KV, Nicosia, Cyprus). In order to investigate the size distribution of silica NPs, a dynamic light scattering (DLS) test was performed using the Malven ZS Nano analyzer (Malven Instrument Inc., London, UK). Results of TEM and DLS analysis were depicted in Figure 2 a,b, respectively. As the results of the DLS test revealed, the size distribution of silica NPs is 18 nm to 38 nm, with an average size of 25 nm. According to the thin pore throats of the carbonate rocks, determination of the maximum radius of flocculated NPs is a crucial matter in NPs flooding. As determined by the DLS analysis, the maximum flocculated size of silica NPs is almost 38 nm, which confirms the ability of NPs to pass through the pore throats (minimum size of 0.05 µm to 2 µm as measured by mercury injection capillary pressure (MICP) tests).
9
Nanoemulsion Droplet Size and Morphology
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The measurement of droplet size of nanoemulsion formulations was determined using Dynamic Light Scatteroscope I (K-One LTD., Korea). The morphological study of nanoemulsion was carried using Transmission Electron Microscopy (Philips EM208S, 100KV, Netherland).
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