Fluorescence microscopy and bright field TEM were performed on the very same silicon nitride TEM windows (prepared as described above) before and after subjecting them to ID-MFM analysis, respectively. Fluorescence microscopy was performed using a Zeiss Axiovert 200 microscope equipped with appropriate filter cubes and a Hamamatsu camera. Bright field TEM imaging was performed using a JOEL JEM 1400 TEM (JOEL USA, Peabody, MA) operating at 80 kV and imaged using a Veleta digital camera (EMSIS). FIJI ImageJ was used to measure the width (diameter) of the SPIONs in TEM images.
Axiovert 200 microscope
Manufactured by Hamamatsu Photonics
The Axiovert 200 is an inverted research microscope designed for a variety of applications. It features a stable, ergonomic design and supports a range of observation methods, including brightfield, phase contrast, and fluorescence imaging. The microscope is equipped with a high-quality optical system that provides clear, detailed images.
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Lab products found in correlation
2 protocols using axiovert 200 microscope
1
Characterizing Silicon Nitride SPION Samples
2
Characterizing Silicon Nitride SPION Samples
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