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223 protocols using jsm 5600lv

1

Characterization of Synthesized Detergent

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Firstly, the stoichiometry of the synthesized DDM is examined via by employing the energy-dispersive X-ray spectra ((EDX), JEOL JSM-5600 LV, Tokyo, Japan). To confirm the formation of the exact sample with detected functional groups, Fourier transform infrared (FT-IR) spectroscopy (NICOLET iS10 model instrument, Tokyo, Japan) was conducted over a wide range (400–4000 cm−1). The crystal structure of the samples was investigated via the x-ray diffraction technique (XRD; Shimadzu XRD-6000). XRD patterns were obtained in the range of 2θ from 17° to 90° at room temperature. Cu Kα was used as a radiation source of wavelength λ = 0.15408 nm, scan rate 0.8°/min, operation voltage 50 kV, and current 40 mA [20 (link),21 (link)]. Information on the surface morphology of the samples’ particles was obtained using scanning electron microscopy ((SEM), JEOL JSM-5600 LV, Tokyo, Japan). Finally, the shape and size of the synthesized samples were obtained by a high resolution Transmission electron microscopy ((HRTEM), JEOL JSM-5600 LV, Tokyo, Japan).
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2

Characterization of Amy-F Nanoparticles

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High-resolution transmission electron microscopy (HR-TEM) (JEOL JSM-5600 LV, Japan) was used to obtain the size and shape of the synthesized Amy-F nanoparticles. Using the X-ray diffraction technique (XRD; Shimadzu XRD-6000) the amorphous structure of the synthesized Amy-F nanoparticle samples was inspected. XRD spectra were acquired in the range of 2θ from 17° to 90° at 25 °C. Copper K-α is a radiation source of scan rate 0.8°/min, wavelength λ = 0.15408 nm, current 40 mA and operation voltage 50 kV. Information about the surface morphology and appearance of the samples' particles is obtained using scanning electron microscopy (SEM), JEOL JSM-5600 LV, Japan). FTIR analysis (JASCO FT-IR 3600, KBr Pellet method, and wavenumber range from 400 to 4000 cm−1) was carried out to reveal chemical functional groups established among the prepared sample. Finally, the energy dispersive X-ray spectra (EDX) (JEOL JSM-5600 LV, Japan) were examined to confirm nanoparticle formation.
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3

Titanium Content Analysis of Samples

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The EDS analysis was performed using a SEM (JEOL-JSM 5600LV, Tokyo, Japan) equipped with an X-radiation detector EDS (Voyager, Noran Instruments), operated in low vacuum and backscattered electron mode. This EDS equipment contains an ultrathin Norvar window and works with a Windows NT-based (Vantage) digital microanalysis system. The surfaces of disc-shaped samples (2 × 4 mm; n = 4) were carbon coated via evaporation of high purity carbon rods (Denton Vacuum Desk II, Moorestown, NJ, USA). The whole area of the sample surface was observed by SEM (JEOL-JSM 5600LV, Tokyo, Japan) set at a magnification of 100x, with a working distance of 20 mm and operated at accelerating voltage of 15 kV. The measurements were performed on four different areas of each sample's surface. They were then measured for their titanium (wt% Ti) content, with results expressed as a percentage by Easy Macro software (Noran Instruments, mod. Vantage v.1.2, Middleton, WI, USA).
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4

Characterization of ZnCex Fe2-xO4 Spinel Ferrites

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The stoichiometry of the ZnCexFe2−xO4 (X = 0.0, 0.02, 0.04, 0.06, 0.08) samples was examined using energy dispersive X-ray spectra (EDX) (JEOL JSM-5600 LV, Japan). In order to confirm the formation of the spinel ferrite phase, Fourier transform infrared (FTIR) spectroscopy using a NICOLET iS10 model instrument was conducted over a range from 350 to 3000 cm−1. The crystal structure of the samples was investigated using X-ray diffraction (XRD) (Shimadzu XRD-6000, Japan). XRD patterns were obtained in a range of 2θ from 17° to 90° at room temperature. Cu Kα was used as the radiation source of wavelength λ = 0.15408 nm, with a scan rate of 0.8°/min, an operating voltage of 50 kV, and a current of 40 mA [139 (link),140 (link)]. Information about the shape and grain size of the sample particles was obtained using high resolution scanning electron microscopy (SEM) (JEOL JSM-5600 LV, Japan). Finally, the particle size distribution, the hydrodynamic radius, and the polydispersity index (PDI) of the synthesised ZnCexFe2−xO4 (X = 0.0, 0.02, 0.04, 0.06, 0.08) samples were determined by dynamic light scattering (DLS; Malvern devise, UK) and the indirect measurement of the surface charges of ZnCexFe2−xO4 (X = 0.0, 0.02, 0.04, 0.06, 0.08) samples was estimated by the zeta potential analyser (Malvern devise, UK) at the culture media as used in the treatments.
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5

Comprehensive Nanoparticle Characterization

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The stoichiometry of the synthesized nano-samples was examined using energy dispersive X-ray spectra (EDX), JEOL JSM-5600 LV, Japan. The crystal structure of the samples was investigated using X-ray diffraction (XRD) (Shimadzu XRD-6000, Japan). XRD patterns were obtained in a range of 2θ from 17° to 90° at room temperature. Cu Kα was used as the radiation source of wavelength λ = 0.15408 nm, with a scan rate of 0.8°/min, an operating voltage of 50 kV, and a current of 40 mA. Information about the shape and grain size of the sample particles were obtained using scanning electron microscopy (SEM) (JEOL JSM-5600 LV, Tokyo, Japan). The shape and size of the synthesized samples were obtained by transmission electron microscopy (TEM, JOEL JEM-1400, Tokyo, Japan) at 80 kV accelerating voltage. Finally, particle size distribution, the hydrodynamic radius, and polydispersity index (PDI) of the synthesized samples was determined by dynamic light scattering (DLS; Malvern Panalytical, Malvern, UK).
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6

Synthesis and Characterization of C-Coated ZrO2/Mn-Mg-Zn Ferrite Nanocomposite

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The Fe, Zn, Mg, and Mn source materials were obtained from Sigma Aldrich. These materials include Fe (NO3)3·9H2O (98.0%), ZnSO4·7H2O (98%), Mg (NO3)2·6H2O, and Mn (NO3)2·4H2O (99%). They were used without any additional purification. Moreover, citric acid (C6H8O7, 99.57%) was employed as a fuel source. Our prior study described the C-coated ZrO2/Mn-Mg-Zn ferrites (CZ-FN) preparation method in detail [7 (link)]. A scanning electron microscope [SEM, (JEOL JSM-5600 LV, Japan)] was also used to create surface images of CZ-FN nanocomposite at variable vacuum without any coating at 12 kV accelerating voltage with a back-scatter detector that offered a clear insight into the morphology of the CZ-FN nanocomposite surface. The elemental composition and mapping images were obtained using the energy-dispersive X-ray analysis spectra (EDX, JEOL JSM-5600 LV, Japan). The functional groups in the CZ-FN nanocomposite were identified using Fourier transforms infrared (FT-IR) spectroscopy (NICOLET iS10 model equipment).
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7

Membrane Characterization via SEM, FTIR, TGA

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The cross section of the composite membrane was confirmed using SEM analyses (JEOL JSM-5600LV, JEOL, Tokyo, Japan). The IR measurements were performed using an FTIR spectrometer (VERTEX 70, BRUKER, Billerica, MA, USA); 16 scans were signal averaged with a resolution of 4 cm−1. The thermal stability of the membranes was measured using TGA (Universal V4.5 A, TA Instruments, New Castle, DE, USA).
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8

Scaffold Characterization by SEM

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SEM was used to analyze the architectural features of the plain scaffolds and cell adhesion to the scaffold surfaces. Cellularized samples underwent preliminary fixation (4% neutral buffered formalin in PBS, overnight at 4°C), dehydration in a graded series of ethanol aqueous solutions up to anhydrous ethanol, drying by the critical point method (Balzers CPD030, Oerlikon Balzers, Balzers, Liechtenstein), and cross-sectioning. Samples were mounted on aluminum stumps, sputter-coated with gold (Edwards Sputter Coater S150B, Edwards, NY, USA) and examined with a scanning electron microscope (JEOL JSM-5600 LV, JEOL Ltd, Tokyo, Japan).
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9

Scanning Electron Microscopic Evaluation of Laser-Irradiated Root Canals

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Results from both methods were analyzed statistically using nonparametric tests; comparison between the leakage results according to the different additional cleaning protocols was made with Kruskal-Wallis and Mann-Whithney U tests. The level of significance was set at 0.05.
Scanning Electron Microscopic Evaluation. Limited information exists regarding the morphologic changes following Er,Cr:YSGG laser irradiation in root canals after irrigation with both NaOCl and EDTA. In order to visualize the effect of the cleaning protocol on the root canal walls, SEM analysis was performed on all experimental groups. Three additional teeth from each experimental group were analyzed by SEM [25 (link)]. Using small rotating discs, deep grooves were cut on the buccal and palatal surfaces without perforating the root canal. The roots were then split with a sharp chisel and a hammer. Care was taken to include the apical foramen in the fracture line. The samples were then dehydrated in ascending series of aqueous ethanol, critically point dried with liquid CO2, sputter coated with gold (JEOL JFC1200, JEOL LTD, Japan), and examined under the scanning electron microscope (JEOL JSM-5600-LV, JEOL LTD, Japan).
Representative microphotographs were taken by an independent blind investigator at 2000x magnification at 1, 3, 6, 8, and 12 mm from the apical extent of the preparation.
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10

Multimodal Imaging of Bacterial Biofilms

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The proper assessment of the existence, the quality and topography of the BFF used the following imaging techniques: OCT, SEM and FTIR. The OCT measurements were performed by an OCTG-1300 Handheld Scanner (THORLABS GmbH, Luebeck, Germany) equipped with an OCTH-LK30 lens kit (THORLABS GmbH, Luebeck, Germany). The images were further processed using Adobe Photoshop to emphasize the biofilm by coloring in a different shade for each strain.
The SEM images were obtained using a JEOL/JSM 5600-LV (JEOL Ltd., Tokyo, Japan). For this technique samples were washed with absolute ethanol and were further carbon layered with plasma sputtering equipment.
In order to record the FTIR spectra of the bacterial biofilms formed on the surface of the PLA printed plates, a Spectrum BX FTIR spectrometer (PerkinElmer, Sunnyvale, CA, USA) provided with an Attenuated Total Reflectance (ATR PIKE MIRacleTM, Madison, WI, USA) with a diamond crystal plate was used. The resolution was 4 cm−1 in the range of 4000–800 cm−1. For this characterization step, no sample preparation was necessary. Using the attenuated total reflection (ATR) accessory alongside the traditional infrared spectroscopy allowed for a direct visualization of the characteristic spectra of the biofilms.
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