The VersaProbe III Scanning XPS Microprobe (PHI 5000) is a versatile X-ray photoelectron spectroscopy (XPS) instrument designed for surface analysis. It provides high-resolution, high-sensitivity XPS data for a wide range of materials.
Example 3
X-ray photoelectron spectroscopy (XPS) spectra of bare graphene on a copper substrate were collected on a VersaProbe III Scanning XPS Microprobe (PHI 5000, Physical Electronics, Chanhassen, Minn.). The observed elemental surface composition of bare graphene on a copper substrate was found to be 57.1 mol % carbon, 12.7 mol % oxygen, and 30.2 mol % copper, as shown in TABLE 7.
Example 9
X-ray photoelectron spectroscopy (XPS) spectra of graphene modified with Pyr-B(OH)2 were collected on a VersaProbe III Scanning XPS Microprobe (PHI 5000, Physical Electronics, Chanhassen, Minn.). The results for the elemental surface composition of graphene modified with Pyr-B(OH)2 are shown in Table 4.
Example 13
X-ray photoelectron spectroscopy (XPS) spectra of bare graphene on a copper substrate were collected on a VersaProbe III Scanning XPS Microprobe (PHI 5000, Physical Electronics, Chanhassen, Minn.). The observed elemental surface composition of bare graphene on a copper substrate was found to be 56.3 mol % carbon, 11.0 mol % oxygen, and 32.6 mol % copper. The high resolution C1s XPS spectrum of bare graphene (
Example 11
XPS spectra of graphene modified with perbenzylated β-cyclodextrin (β-CDBn21) were collected on a VersaProbe III Scanning XPS Microprobe (PHI 5000, Physical Electronics, Chanhassen, Minn.). The results for the elemental surface composition of graphene modified with β-CDBn21 are shown in Table 6.
Example 14
Graphene samples modified either with α-CDBn18, β-CDBn21, or γ-CDBn24 were characterized by XPS. XPS spectra of graphene modified with either perbenzylated α-cyclodextrin (α-CDBn18), perbenzylated β-cyclodextrin (β-CDBn21), or perbenzylated γ-cyclodextrin (γ-CDBn24) were collected on a VersaProbe III Scanning XPS Microprobe (PHI 5000, Physical Electronics, Chanhassen, Minn.).
After the self-assembly of the perbenzylated cyclodextrins, the Cu percentage was reduced significantly, and the C and O percentages increased. This trend is consistent with the composition of the cyclodextrin monolayers, which is 84.4 mol % carbon and 15.6 mol % oxygen for all three cyclodextrins (See Tables 5-7). The high resolution XPS spectra for C1s and O1s confirmed the surface modification with α-CDBn18 by showing a much smaller Cu—O peak as compared to bare graphene and much larger peaks for the sp3 carbon and C—O—C carbon and oxygen atoms pertaining to the perbenzylated cyclodextrins (
Example 3
X-ray photoelectron spectroscopy (XPS) spectra of bare graphene on a copper substrate were collected on a VersaProbe III Scanning XPS Microprobe (PHI 5000, Physical Electronics, Chanhassen, MN). The observed elemental surface composition of bare graphene on a copper substrate was found to be 57.1 mol % carbon, 12.7 mol % oxygen, and 30.2 mol % copper, as shown in TABLE 7.
Example 12
XPS spectra of graphene modified with perbenzylated γ-cyclodextrin (γ-CDBn24) were collected on a VersaProbe III Scanning XPS Microprobe (PHI 5000, Physical Electronics, Chanhassen, Minn.). The results for the elemental surface composition of graphene modified with β-CDBn24 are shown in Table 7.
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