Smartlab studio 2 software

To analyze the formation of HA after the setting reaction, each of the scaffold compositions was powdered and analyzed using XRD (MiniFlex, Rigaku Corporation, Xizhimenwai Ave, Japan). The powder was placed in the sample holder and loaded into the machine. The 2θ was set from 5 to 70 degrees with a scan speed of 2°/min and a scan step of 0.02 degrees. The voltage and current were set at 45 V and 15 mA with an ultimate resolution of 0.0025. The diffractogram was analyzed using SmartLab Studio II software (Rigaku, Xizhimenwai Ave, Japan).

Macroscopic images were taken using a VHX digital microscope (Keyence, Osaka, Japan). The microstructure was investigated with a Scanning Electron Microscope EVO MA 25 (Zeiss, Oberkochen, Germany). The samples in the form of plates were prepared for SEM analysis by grinding on abrasive from #200 to #2000 and polishing using colloidal SiO₂ to obtain a mirror surface and then etched with Kroll reagent (92 mL distilled water + 6 mL nitric acid + 2 mL hydrofluoric acid). Phase analysis was performed using an X-ray powder diffractometer MiniFlex 600 (Rigaku, Tokyo, Japan) and Smart Lab Studio II software (Rigaku, Tokyo, Japan). XRD was conducted using CuKα radiation and a scanning speed of 2°/min from 30° to 90°. Square surfaces (20 mm × 20 mm) were polished using #2000 abrasive and colloidal SiO₂ with polishing cloth to ensure that the diffractometry was performed in the interior structure.

The mineralogy of the sediment LKSD-1 was determined qualitatively by powder X-ray diffraction using a Rigaku Miniflex 600 diffractometer (Rigaku, Tokyo, Japan) equipped with a monochromatized source of Cu Kα radiation (λ = 0.15405 nm) (Figure S2). A step size of 0.03° over the 2θ scan range 5–85° and a scanning rate of 2°·min⁻¹ were used to record the X-ray diffraction patterns, and the minerals were identified using the SmartLab Studio II software (Ver.1.4.3, Rigaku, Tokyo, Japan).
Total organic carbon (TOC) and inorganic carbon (TIC) contents in the sediment sample were determined with a LECO-TOC RC612 carbon analyzer (LECO, St. Joseph, MO, USA) (Table S6). The TOC content was determined as released carbon dioxide at a temperature ranging from 105 °C to 550 °C, while the TIC content was determined by increasing the temperature from 550 °C to 1000 °C. Before the sample analysis, the background carbon within the system was determined, followed by instrument calibration with known calibration standards (CaCO₃ and synthetic carbon).