The size and morphology of the GPA NPs was characterized by Hitachi S-4800 field emission scanning electron microscopy, operating at an accelerating voltage of 10 kV. To obtain high resolution images from the SEM analysis, all samples were deposited on a silicon wafer and allowed to dry. The SEM images were processed using the Image J software, and the size histograms were constructed from an analysis of 1000 particles. The hydrodynamic size and surface zeta potential were measured by dynamic light scattering (DLS) measurements (Malvern Zetasizer NANO-ZS90). The UV-visible absorption spectra were recorded on Thermo Evolution 300 spectrophotometer in the range of 300-800 nm. The gentamicin content was determined by Sodium phosphotungstate precipitation method.
S 4800 field emission scanning electron microscopy
Manufactured by Hitachi
Sourced in Japan
The S-4800 field emission scanning electron microscopy is a high-performance imaging and analysis instrument. It utilizes a field emission electron source to generate a high-resolution electron beam, which is then focused and scanned across the sample surface. The instrument can produce detailed images of nanoscale features and structures.
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Lab products found in correlation
Ultima 4 x ray diffractometer, by Rigaku (2 mentions)
Pdxl software, by Rigaku (2 mentions)
Evolution 300 spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
Tecnai g2 f20, by Hitachi (1 mentions)
Dpx 500 spectrometer, by Bruker (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
D8 advance x ray diffractometer, by Bruker (1 mentions)
Uv 2600 spectrophotometer, by Shimadzu (1 mentions)
Tristarii plus apparatus, by Micromeritics (1 mentions)
Tecnai g2 f20 transmission electron microscope, by Thermo Fisher Scientific (1 mentions)
6 protocols using s 4800 field emission scanning electron microscopy
1
Characterization of GPA NP Morphology
2
Characterization of Li-Rich Cathode Powders
3
Characterization of Li-Rich Cathode Powders
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The crystalline phase of each Li rich cathode powder was characterized by Rigaku Ultima IV X-ray diffractometer using CuKα radiation. The scan range was set between 10–80 2θ degrees for each measurement. The crystal structures of all as-synthesized powders were processed with the aid of PDXL software, provided by Rigaku Corporation. Unit cell visualization was drawn with VESTA software. The surface feature of each powder was investigated with a Hitachi S-4800 Field Emission Scanning Electron Microscopy (FESEM). To unravel local geometry and valence states of each transition metal in the composite metal oxide cathode, we ran X-ray absorption spectra at beam line X-3A and X18-A of the National Synchrotron Light Source (NSLS-I) located at Brookhaven National Laboratory. XAS experiments were performed in ex-situ mode using electrodes extracted from coin-cells. The electrodes were sealed with Kapton tape and stored in glass vials followed by packing in moisture impermeable aluminized bags in Ar filled glove box before transporting to NSLS-I. Each raw scan was calibrated, normalized and aligned with respect to reference foils through Artemis software.26 (link)
4
Characterization of Mn-doped Samples
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The phase structure and crystallinity of the samples were identified by X-ray diffraction (XRD, ULTIMAIV RIGAKU, Tokyo, Japan) in the range of 10–80° with a scan rate of 10°/min. The morphology of the samples was investigated using S-4800 field emission scanning electron microscopy (FESEM, Hitachi, Tokyo, Japan) and transmission electron microscopy (TEM, Tecnai G2 F20, Hillsborough, OR, USA). The valence states of Mn in the samples was characterized by X-ray photoelectron spectroscopy (XPS, PHI QUANTERA-II, ULVAC-PHI, INC., Tokyo, Japan) using amonochromatic Al K X-ray source (h = 1486.6 eV). The BELSORP-max specific surface area and pore size distribution instrument (ANKERSMID B.V. Holland, Nijverdal, Netherlands) were used to determine the pore size distribution and specific surface area.
5
Electrochemical Characterization of Modified Electrodes
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Electrochemical experiments were carried out on a CHI 630 Electrochemical Workstation (Shanghai Chenhua Co., Ltd.) with a three-electrode system, consisting of a reference electrode of Ag/AgCl electrode, a platinum wire auxiliary electrode, and a corresponding modified GCE. The electrochemical impedance spectroscopy (EIS) measurements were performed in a glass cell filled with 5 × 10−3 M Fe(CN)63−/Fe(CN)64− (1 : 1) + 0.1 M KCl solution. Phosphate buffer solutions (PBS) were used as the supporting electrolyte. The whole electrochemical measurements were carried on air atmosphere. Hitachi S-4800 field-emission scanning electron microscopy with an accelerating voltage of 10.0 kV was used to observe the surface morphologies of different films and samples were coated with a gold layer. 1H NMR (500 MHz) spectrum was recorded on the Bruker DPX500 spectrometer using TMS as the internal standard of CDCl3.
6
Comprehensive Characterization of Materials
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The X-ray diffraction (XRD) patterns were obtained with a Bruker D8 Advance X-ray diffractometer using Cu Ka radiation source (k = 1.5406 Å). UV-Vis diffuse reflectance spectra (UV-Vis DRS) were collected on a Shimadzu UV-2600 spectrophotometer with BaSO 4 as a reference. Scanning electron microscopy (SEM) was performed on a Hitachi S-4800 field emission scanning electron microscopy. Transmission electron microscope (TEM), high resolution transmission electron microscopy (HRTEM), and selected area electron diffraction (SAED) patterns were recorded on a FEI Tecnai G2 F20 transmission electron microscope operated at 200 kV. HRTEM was analyzed by the Digital Micrograph software. X-ray photoelectron spectroscopy (XPS) measurements were performed by using an AMICUS System (Shimadzu) with Al Ka (1486.8 eV) radiation. Binding energies were calibrated with the contaminated graphitic carbon adsorbed to the surface (C1s = 284.6 V). The specific surface areas were measured by nitrogen adsorption-desorption isotherms at 77 K using a Micromeritics TriStar II Plus apparatus. Before measurement, the samples were degassed at 423 K under vacuum for 6 h. Surface charge was evaluated on a zeta potential analyzer (Malvern Zetasizer NANO ZS). The Fourier transform infrared spectra (FT-IR) were recorded with KBr pellet on a Thermo Nicolet Magna-IR 750 spectrometer.
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