EDS spectrum images of regions of interest chosen in STEM HAADF images were acquired on a windowless 100 mm2 XMaxN 100TLE Silicon Drift Detector (SDD) with a solid angle of ~0.98 sr (Oxford Instruments NanoAnalysis, Concord, MA) with a dwell time of 5 μs/pixel.
Xmaxn 100tle silicon drift detector
Manufactured by Oxford Instruments
The XMaxN 100TLE Silicon Drift Detector (SDD) is a high-performance X-ray detector designed for energy dispersive X-ray spectroscopy (EDS) applications. The SDD technology provides efficient detection and processing of X-ray signals, enabling accurate elemental analysis.
Automatically generated - may contain errors
Lab products found in correlation
2 protocols using xmaxn 100tle silicon drift detector
1
Spectrum Imaging of STEM HAADF Regions
2
Spectrum Imaging of STEM HAADF Regions
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