(SEM) using a Hitachi S3000N equipment and by field-emission scanning
electron microscopy (FESEM) using a Zeiss Merlin VP equipment. For
this purpose, SEM and FESEM images were acquired at different magnifications
and analyzed using image analysis software Buehler-Omnimet Enterprise
(Illinois). An X-ray Bruker XFlash 3001 EDX probe connected to the
former electron microscope was used to study the chemical composition.
A Bruker D8 Advance X-ray diffractometer was used to determine the
crystalline phases in the metal during the various processing steps.