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Merlin vp

Manufactured by Zeiss
Sourced in Germany

The Merlin VP is a versatile scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a high-performance electron column and advanced detection capabilities to provide detailed information about the surface and composition of materials.

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6 protocols using merlin vp

1

Morphological and Compositional Analysis of Metal Foam

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The foam morphology was studied by scanning electron microscopy
(SEM) using a Hitachi S3000N equipment and by field-emission scanning
electron microscopy (FESEM) using a Zeiss Merlin VP equipment. For
this purpose, SEM and FESEM images were acquired at different magnifications
and analyzed using image analysis software Buehler-Omnimet Enterprise
(Illinois). An X-ray Bruker XFlash 3001 EDX probe connected to the
former electron microscope was used to study the chemical composition.
A Bruker D8 Advance X-ray diffractometer was used to determine the
crystalline phases in the metal during the various processing steps.
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2

SBF-SEM Imaging of Promastigotes and Midguts

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The tips of resin blocks containing samples were trimmed and mounted onto aluminium pins using conductive epoxy glue and silver dag, and then sputter coated with a layer (10–13 nm) of gold in an Agar Auto Sputter Coater (Agar). Before SBF-SEM imaging, ultrathin sections (70 nm) of the block face were examined in a Jeol JEM 1400 Flash transmission electron microscope (JEOL), to verify sample quality. Samples were then imaged in a Merlin VP compact high resolution scanning electron microscope (Zeiss) equipped with a 3View 2XP stage (Gatan-Ametek), an OnPoint back-scattered electron detector (Gatan-Ametek) and a focal charge compensation device (Zeiss). The following imaging conditions were used: 1.8kV, 20 μm aperture, 100% focal charge compensation, 5nm pixel size, 2–4 μs pixel time, 100nm (in vitro promastigotes) or 75nm (midguts) section thickness.
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3

Comprehensive Nanomaterial Characterization

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The size and morphology of the as-synthesized nanomaterials were determined using a Thermo Fisher Scientific Talos F200X G2 high-resolution transmission electron microscope (HRTEM). The morphology and elemental composition mapping were studied using a Zeiss Merlin VP compact field-emission scanning electron microscope (FESEM) and energy dispersive X-ray spectroscopy (EDS), respectively. The determination of various functional groups was done using a Shimadzu Iraffinity-1s Fourier transform infrared spectrophotometer. X-ray photoelectron spectroscopy for the characterization of surface functionality and elemental composition was carried out using a PHI 5000 versa probe III instrument. The count per second of different functional groups as a function of the BE (eV) was measured using a standard monatomic argon ion gun, which was capable of generating 5 eV to 5 keV Ar ion beams. UV-vis electronic absorption and fluorescence emission spectra of the water-dispersed carbon nanomaterials were analyzed using an Agilent Carry 5000 UV-Vis-NIR and Hitachi F-7000 (150 W xenon lamp) fluorescence spectrophotometer, respectively. The zeta potential measurement was carried out using an Anton Paar Litesizer 500 system.
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4

Characterization of Thin Film Nanostructures

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SEM (Zeiss Merlin VP) and transmission electron microscopy (TEM) (Zeiss Libra 120 Plus; aberration-corrected STEM, Nion U100) were used for imaging and elemental analysis of the thin films. Representative TEM images are shown in fig. S1 for a film grown on a TEM grid for analytical purposes. Representative SEM images of CNS surface are shown in fig. S5. The side view images of CNS were illustrated in fig. S6. XPS measurements of the C1s region for both pristine and O-etched CNS were made at beamline 9.3.2 of the Advanced Light Source.
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5

Nanowire Structural Characterization

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The presence of the nanowires on the tape was verified using Zeiss Merlin VP scanning electron microscopy (SEM) and energy dispersed x-ray spectroscopy mapping (EDX). Nanowires were also examined using FEI-Titan transmission electron microscopy (TEM) to verify the structure from the diffraction pattern. X-ray diffraction was used to scan the whole sample to confirm the primary phase of the samples.
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6

Peptide Hydrogel Scaffold Characterization

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ACM, ACM+RAD, and ACM+RAD/PFS were fixed with 2.5% glutaraldehyde for 2 h, washed twice in PBS, and subsequently dehydrated using a series of graded ethanol solutions, respectively. Once the peptide hydrogel scaffold was in 100% ethanol, the ethanol was dried using a CO2 critical point dryer (Samdri-PVT-3D; Tousimis, Rockville, MD, USA). Upon CO2 removal, peptide hydrogel scaffold was sputter-coated with platinum alloy and examined using a MERLIN VP compact microscope (Carl Zeiss, Jena, Germany) at 15 kV.
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