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Axis his 165 spectrometer

Manufactured by Shimadzu
Sourced in United Kingdom

The AXIS HIS 165 spectrometer is a high-performance laboratory instrument designed for the analysis of materials. It utilizes X-ray photoelectron spectroscopy (XPS) technology to provide detailed surface and elemental information about the sample under investigation. The spectrometer features a hemispherical electron energy analyzer and a multi-channel detector for efficient data collection. It is capable of performing both qualitative and quantitative analysis of a wide range of materials.

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5 protocols using axis his 165 spectrometer

1

Structural Characterization of Advanced Materials

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The structures of the samples were investigated by X-ray diffraction (XRD) performed on a Rigaku D/Max-2500 diffractometer with Cu Kα radiation. Raman spectrum was performed with a Renishaw InVia Raman spectrometer using laser excitation at 514.5 nm. Lorentzian fitting was carried out to confirm the positions and widths of the D and G bands. ID and IG are the intensities of the D and G bands, respectively. X-ray photoelectron spectroscopy (XPS) analysis was performed using AXIS HIS 165 spectrometer (Kratos Analytical) with a monochromatized Al Kα X-ray source (1486.7 eV). Scanning electron microscopy (SEM) images were obtained on an FEI NanoSem 430 field emission scanning electron microscope using an accelerating voltage of 20 kV. Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HR-TEM) were conducted in an FEI Tecnai G2 F20 electron microscope using an acceleration voltage of 200 kV.
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2

Comprehensive Characterization of Carbon Dots

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The surface morphology was characterized by a transmission electron microscope (TEM, JEOL JSM-IT100), an AIST-NT Smart atomic force microscope (AFM) and JSM-6700F scanning electron microscope (SEM). The X-ray diffractometer (Smartlab) using Cu kα as the irradiation source was used to obtain the XRD patterns. The Fourier transform infrared spectra (FT-IR) were recorded on a Thermo Scientific Nicolet IS10 FTIR spectrometer. The X-ray photoelectron spectroscopy (XPS) was measured on a Kratos AXIS HIS 165 spectrometer with a monochromatized Al KR X-ray source (1486.7 eV). The fluorescence and chemiluminescence was measured by a F-7000 spectrofluorometer (Hitachi, Japan). The absorption spectrum was measured by an UV/VIS spectrophotometer (Hitachi, UH-4150). The fluorescence lifetime of the CDs solution was measured by Horiba FL-322 using a 370 nm Nano-LED monitoring the emission at 675 nm. The ESR spectra of the CDs were recorded by an electron paramagnetic resonance spectrometer (Bruker A300). The Dynamic light scattering (DLS) distribution was measured with Zetasizer Nano. The femtosecond transient absorption (TA) measurements were performed on a Helios pump-probe system (Ultrafast systems). The optical photograph was obtained from a realme V11 5G mobile phone (realme RMX3122, China).
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3

Multifunctional Electrochemical Sensor Fabrication

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Voltammetry and electrochemical
impedance spectroscopy (EIS) were performed with CHI 1210A and CHI
660D electrochemical workstations (Shanghai CH Instrument, China),
respectively. A three-electrode system was used for the electrochemical
experiments, which was composed of the working electrode (Nafion/Mb-HAp@CNF/CILE),
the auxiliary electrode (platinum wire electrode), and the reference
electrode (saturated calomel electrode). Scanning electron microscopy
(SEM) was performed by a JSM-7100F scanning electron microscope (JEOL,
Japan) with transmission electron microscopy (TEM) on a JEM 2010F
instrument (JEOL, Japan). Raman spectrum was obtained on a LabRAM
HR system using 532 nm lasers (Horiba, France) with X-ray photoelectron
spectroscopy (XPS) on an AXIS HIS 165 spectrometer (Kratos Analytical,
UK). FT-IR was carried out using a Nicolet 6700 FT-IR spectrophotometer
(Thermo Fisher Scientific Inc., USA). UV–vis spectroscopy was
recorded on a TU-1901 double-beam UV–vis spectrophotometer
(Beijing General Instrument Ltd. Co., China). The carbonization process
was performed by a BTF-1200C vacuum tube furnace (Anhui Best Equipment
Technology Ltd. Co., China).
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4

Electrochemical Characterization of Luteolin

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Electrochemical experiments were performed on a CHI 660E electrochemical workstation (Shanghai CH Instruments, China) using a traditional three-electrode system, including Pt–BPC/CILE as the working electrode, Ag/AgCl (sat. KCl) electrode as the reference electrode and a platinum wire electrode as the auxiliary electrode. Cyclic voltammetry (CV) and differential pulse voltammetry (DPV) were performed in pH 3.0 PBS containing a certain amount of luteolin or sample. DPV parameters were as follows: pulse amplitude of 0.05 V, pulse width of 0.02 s, pulse period of 0.2 s, and quiet time of 0.5 s. The surface morphologies, EDX and mapping of the as-prepared materials were characterized using a JSM-7100F scanning electron microscope (SEM, JEOL, Japan). X-ray photoelectron spectra (XPS) were obtained by using an AXIS HIS 165 spectrometer (Kratos Analytical, UK). Raman spectra with 532 nm lasers were obtained on a LabRAM HR system (Horiba, France).
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5

Comprehensive Characterization of MnO2@FBPC/CILE

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The morphologies of the as-prepared materials were examined using a JSM-7100F scanning electron microscope (JEOL, Japan). X-ray diffraction (XRD) measurements were performed on a D2 phaser advance diffractometer (Bruker, Germany) with Cu Kα (λ = 1.5406 nm) radiation. X-ray photoelectron spectroscopy (XPS) and the surface elemental compositions were performed on an AXIS HIS 165 spectrometer (Kratos Analytical, UK). Raman spectrum was obtained on a LabRAM HR system (Horiba, France) at an excitation wavelength of 532 nm. Electrochemical measurements were carried out on a CHI 660E electrochemical workstation (Shanghai CH Instruments, China) with a traditional three-electrode system, including MnO2@FBPC/CILE as the working electrode, Ag/AgCl (saturated KCl) as the reference electrode, and a platinum wire electrode as the counter electrode. An Agilent 1200 (Agilent Technologies, USA) was used for HPLC with chromatographic separation performed on the Agilent Diamonsil C18 column (250 mm × 4.6 mm, 5 μm, USA). HPLC mobile phase consisted of a 0.4% phosphoric acid–methanol (48 : 52, v/v) mixture, which was filtered through a 0.45 μm filter, followed by degassing under vacuum and passed at a flow rate of 0.5 mL min−1 at an injection volume of 10 μL. The measurement process was carried out in a chromatographic column at 30 °C with the detector wavelength set at 368 nm.
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