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Mfp 3d afm system

Manufactured by Oxford Instruments

The MFP-3D AFM system is a high-performance atomic force microscope (AFM) designed for advanced surface characterization. It provides nanoscale imaging, measurement, and analysis capabilities. The MFP-3D AFM system is capable of operating in various imaging modes to study the topography and other properties of a wide range of samples.

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4 protocols using mfp 3d afm system

1

Platinum Cantilever AFM Measurements

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PFM measurements were performed at room temperature using Asylum Research MFP-3D AFM system. Platinum coated Si cantilevers (Olympus OMCL-AC240TM) were used in the measurements.
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2

Atomic Force Microscopy of 2D Materials

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The morphology of the samples was investigated employing an Asylum Research MFP-3D AFM system operating under ambient conditions. NT-MDT NSG30 and Olympus AC160TS probes were used, with typical force constants of 20–80 N/m and tip curvature radii of 5–10 nm. AFM topography images of the samples were processed using the open source software Gwyddion (version 2.38). For each image, first a step line correction in the scanning direction was applied, followed by a three point plane leveling with the mean plane height set to zero value. In the cases of hBN/SiO2 step edges or hBN terraces, the three points were chosen on the lowest level, e.g., SiO2. The software was used to calculate the volume of 6P deposited per unit area and to select 6P needle-like crystallites for statistical analysis of their lengths and orientation. AFM was also employed to determine the height of the hBN flakes prior to 6P deposition. For all flakes used in the study, the height was determined considering histograms of an area containing both the flake and the bare SiO2 substrate. From these, the height was estimated as a peak-to-peak distance and the deviation of the measured height was estimated as a half width at half maximum of the histogram peak that corresponds to the hBN flake.
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3

Atomic Force Microscopy Analysis of Molecular Crystals

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The morphology of the samples was investigated employing an Asylum Research MFP-3D AFM system operating under ambient conditions. Olympus AC160TS probes were used with typical force constants of 20–80 N/m and tip curvature radii of 5–7 nm. AFM topography images of the samples were processed using the open source software Gwyddion (version 2.38). The thickness of the molecular crystals was estimated considering the total volume on the device active area and presented as an equivalent in complete monolayers (ML) of the bulk structure (in the case of 6P considering up-right standing molecules that form island-like crystallites) of the molecular crystals, since an ideal layer-by-layer growth was not observed. In the considered ranges of the growth temperatures, only the monoclinic β-phase of 6P crystallites is expected (the Baker structure) and the fcc structure of C60. The morphology of C60 films indicated layered growth (step edge height of ~0.8 nm), while 6P films were found to consist of both, islands of up-right standing molecules (~2.6 nm) and needles with flat-laying molecules (taller than 10 nm).
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4

Atomic Force Microscopy of Hydrated Hydrogels

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Atomic force microscopy (AFM) imaging was performed using MFP-3D AFM system (Asylum Research, Santa Barbara, CA) with an open fluid droplet containing deionized water. The COC-gelatin slides were fixed to glass slides using carbon tape and sample bond adhesive (Ted Pella, Redding, CA) for mounting on the AFM stage. Prior to hydrogel contact, AFM cantilevers were calibrated in air and water using the Sader method to ensure reliable topography and elastic modulus measurements [34 ]. All topography images for hydrated hydrogels were collected in contact mode with soft, gold-coated silicon nitride bio-levers (Olympus TR400PB, Asylum Research Probe Store, Santa Barbara, CA) with a constant contact force ranging from 1 to 10 nN to prevent adhesion. After collecting a contact mode image of each gel sample in water, the tip was placed on three different sites on either the micropatterned ridges or troughs and at least 25 force distance curves (FDCs) were collected from each site. The scan rate (0.8 Hz) and distance traveled (1.5 µm) were kept constant for each FDC. All FDCs were analyzed using the Johnson-Kendall-Roberts (JKR) model [35 ] built into the instrument software to estimate the elastic modulus of the hydrogels.
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