Dimension icon pt atomic force microscopy

A 4th harmonic of Q-switched YAG:Nd laser (λ = 266 nm, pulse width = 7 ns) was used for PL excitation, and an Ocean Optics USB2000+VIS-NIR fiber optic spectrometer was employed to record the PL spectra. A closed-cycle helium cryosystem provided the variation of temperature in a range from 10 K to 300 K. Excitation power tuning was realized by THORLABS NUK01 neutral density filters. The surface morphology for sample-A, -B, and -C after molten KOH etching was characterized by Bruker Dimension ICON-PT atomic force microscopy (AFM).

The crystal structure of samples was determined by Rigaku D/max-IIIB X-ray diffraction (XRD) (Cu K_α irradiation, λ = 1.54178 Å). Scanning electron microscope (SEM) and energy-dispersive spectroscopy (EDS) measurement were used to examine the morphology and chemical composition of as-obtained products on FEI Quanta 200F microscope. The thicknesses of SnS_2−xSe_x nanosheets and nanosheets assemblies were measured by Bruker Dimension ICON-Pt atomic force microscopy (AFM). TEM and selected area electron diffraction (SAED) were also recorded on FEI Tecnai G² F30 TEM. The absorption spectra were recored on PerkinElmer Lambda 950 UV/vis/NIR spectrometer. Raman spectra were measured on a LaBRAM HR800 (Jobin Yvon Horiba) Raman spectrometer with a He-Ne laser (λ = 532 nm). X-ray photoelectron spectroscopy (XPS) measurement was characterized on Thermo Fisher Scientific VG K_α Probe spectrometer.