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K alpha thermo scientific axis 165

Manufactured by Thermo Fisher Scientific
Sourced in United States

The K-alpha Thermo Scientific AXIS 165 is a high-performance X-ray photoelectron spectroscopy (XPS) system designed for surface analysis and characterization. It provides detailed information about the chemical composition and electronic structure of materials at the surface level.

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2 protocols using k alpha thermo scientific axis 165

1

Comprehensive Characterization of ZS@BIF Composite

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The mineralogical composition of the iron ore sample and zinc stearate@banded iron formation composite (ZS@BIF) was characterized qualitatively using an X-ray diffraction diffractometer (Bruker D8 XRD). Fourier transform infrared (FTIR) (Spectrometer JASCO, 6300, Japan) was used for surface examination. The surfaces of the banded iron formation host and the fabricated composite ZS@BIF were deeply analyzed by X-ray photoelectron spectroscopy (XPS) using K-alpha Thermo Scientific AXIS 165 (Thermo Fisher Scientific, USA) spectrometer. The adsorption characteristics of n. butyl acetate (BA) and cyclohexane (CH) on ZS@BIF composites were evaluated using FTIR. The surface morphology investigations were performed using a scanning electron microscope (SEM), and the elemental mapping of zinc, iron and oxygen was observed by conducting Energy Dispersive X-Ray Spectroscopy EDS. Grain size analysis was conducted by laser particle size analyzer (BT-2001). Thermo Scientific Automatic pycnometer Pycnomatic ATC was used for density measurement.
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2

Advanced Multimodal Characterization of Composite Materials

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The texture and morphology of the prepared samples were characterized using a field emission electron microscope (FESEM, QUANTAFEG 250). In addition, energy-dispersive X-ray spectroscopy (EDS) and elemental mapping (EM) integrated with basic FESEM were used for elemental surface analysis. Functional groups and chemical bonds were verified using Thermo Nicolet Fourier-transform infrared spectroscopy (FT-IR). Transmission electron microscope (TEM), high resolution TEM (HR-TEM) images, and the selected area electron diffraction (SAED) pattern were captured to confirm the composite structure using JEOL TEM 2100plus instrument. X-Ray Diffraction (XRD) patterns were recorded using Bruker axis D8 diffractometer with radiation source Cu-Kα (λ = 1.5406 nm) at 40 kV and 30 mA to determine the crystalline phases. X-ray photoelectron spectroscopy (XPS) data were collected with K-alpha Thermo Scientific AXIS 165 (Thermo Fisher Scientific, USA) spectrometer to investigate the oxidation states of the existing elements.
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