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K alpha x ray spectrometer

Manufactured by Thermo Fisher Scientific
Sourced in United States

The K-alpha X-ray spectrometer is a laboratory instrument used for elemental analysis. It utilizes X-ray spectroscopy to identify and quantify the elements present in a sample. The core function of the K-alpha spectrometer is to generate and detect X-rays, which are then analyzed to determine the elemental composition of the material under investigation.

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3 protocols using k alpha x ray spectrometer

1

Structural Characterization of Materials

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The crystal structure was characterized by X-ray diffraction (XRD, D/max 2600, Rigaku, Japan) with Cu Kα radiation (λ = 1.5418 Å). The micromorphology and elementary composition were determined by scanning electron microscopy (SEM, SU70, Hitachi, Japan) equipped with energy dispersive X-ray spectroscopy (EDS) and transmission electron microscopy (TEM, FEI, Tecnai TF20). The surface chemical states were characterized by X-ray photoelectron spectroscopy (XPS) employing K-alpha X-ray spectrometer (Thermo, USA).
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2

Colorimetric-based Biomolecule Detection Using Cu-CD/Chitosan Nanocomposite

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Glucose, sucrose, fructose, 3,3′,5,5′-tetramethylbenzidine, Glucose oxidase from Aspergillus niger, glutaraldehyde solution grade II 25% in H2O, copper (II) chloride dihydrate (CuCl2·2H2O), hydrogen peroxidase (30%), and urea were purchased from Sigma-Aldrich (MA, USA). Acetic acid (99.8%) was purchased from Honeywell Fluka (Germany). Citric acid anhydrous was purchased from J. T. Baker (NJ, USA). Chitosan (50,000–150,000 Da) was purchased from Biosynth Carbosynth (UK). Milli-Q water of 18.2 MΩ cm was produced using the Millipore water purification system. All the chemicals used in these assays were of analytical grade.
The UV–visible absorbance and fluorescence spectra were recorded on a Spectra Max® ID3 multimode microplate reader (Molecular Devices, CA, USA). X-ray photoelectron spectroscopy was performed on a Thermo scientific K-Alpha X-ray spectrometer (MA, USA). The high-resolution transmission electron microscopy images were acquired using a JEM-2001F instrument (JOEL, Japan). The Cu-CD/chitosan film morphology was recorded using a field emission scanning electron microscope (FE-SEM, JSM-7500F, JOEL, Japan). The Fourier-Transform Infrared (FT-IR) spectra were recorded on a Spectrum One spectrometer (PerkinElmer, MA, USA).
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3

Comprehensive Characterization of TiO2 Nanoparticles

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Transmission electron microscopy (TEM) was performed with a Jeol 1010 microscope (100 KeV) equipped with Gatan Orius SC600 CCD-2014 camera, and was used to determine NP size distributions. TiO2-NP samples were prepared by dispersion in ethanol (0.1 mg/mL) with sonication for 180 s, and then a drop of the suspension was deposited onto a GYCu200 mesh copper holey carbon (25ct) and/or GSCu200C-50 strong carbon TEM grids. More than 100 individual NPs were measured to determine average particle diameter. X-ray photoelectron Spectrometry (XPS) was performed on a Thermo K-alpha X-ray spectrometer, and was used to analyse the chemical composition of the NPs. X-ray diffraction (XRD) spectroscopy was performed on a Bruker Axs D8 ADVANCE spectrometer, and was used to determine the crystalline phase of the NPs. Thermogravimetric analysis (TGA) was performed on a Perkin Elmer Hyphenated Pyris 1 instrument, and was used to study the NP coating characteristics. Fourier transform infrared (FTIR) spectroscopy was performed on a BRUKER TENSOR 27 spectrometer, where TiO2-NPs were impregnated in KBr discs and was used to study the chemical composition of the NP coatings.
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