Evo 15 sem

Manufactured by Zeiss

Sourced in Germany

The EVO-15 SEM is a scanning electron microscope (SEM) designed and manufactured by Zeiss. It is a versatile and high-performance instrument that provides detailed images and analysis of a wide range of materials and samples. The EVO-15 SEM utilizes an electron beam to scan the surface of a sample, generating signals that are used to create a magnified image of the sample's surface.

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Lab products found in correlation

Close spelling variants of this product

SEM Evo LS 15 SEM EVO High Definition 15 Scanning Electron Microscope EVO SEM EVO 15

2 protocols using evo 15 sem

Characterization of Filter Cake

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After the filtration test, the thickness of the filter cake was tested by an automatic tester for the thickness of filter cake (ZN-1L, Qingdao Senxin Group Co., LTD, Qingdao, China) and was lyophilized to constant weight. The micromorphologies of the surface of filter cakes were observed using an EVO-15 SEM (ZEISS, Aalen, Germany) at an accelerating voltage of 20 kV. Before observation, the samples were gold coated using a sputter coater.

Lv K., Du H., Sun J., Huang X, & Shen H. (2022). A Thermal-Responsive Zwitterionic Polymer Gel as a Filtrate Reducer for Water-Based Drilling Fluids. Gels, 8(12), 832.

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SEM Analysis of Nanopapers

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Scanning electron microscopy
(SEM) micrographs were acquired by an EVO 15 SEM (Zeiss, Germany)
with a beam voltage of 20 kV. The micrographs were taken on the nanopapers
cross-section, obtained by fragile fracture, after soaking in liquid
nitrogen.

Li K., Battegazzore D., Pérez-Camargo R.A., Liu G., Monticelli O., Müller A.J, & Fina A. (2021). Polycaprolactone Adsorption and Nucleation onto Graphite Nanoplates for Highly Flexible, Thermally Conductive, and Thermomechanically Stiff Nanopapers. ACS Applied Materials & Interfaces, 13(49), 59206-59220.

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