H 600 2 transmission electron microscope

The concentrated bacteriophage stocks were negatively stained with phosphotungstic acid (PTA) and were then imaged using a H-600 II transmission electron microscope at 75 kV (Hitachi, Tokyo, Japan) to acquire morphological information of single bacteriophage particles.

A Hitachi S-4800 scanning-electron microscope (SEM, Tokyo, Japan) and Hitachi H-600-II transmission electron microscope (TEM) were used to characterize the morphology of the PEGN nanostructures. The critical structures in the PEGN particles were recorded using a Siemens D8 Advance X-ray diffractometer (XRD, Munich, Germany) with Cu-Ka radiation (=0.15418 nm) over a range of 5° ≤ 2° ≤ 80°. The Raman analysis was carried out using a Via-Reflex Raman microspectrometer (Renishaw, Wotton-under-Edge, UK) using a continuous-wave laser with a wavelength of 532 nm. Under carbon-hybridized conditions, surface chemical statements were recorded using an X-ray photoelectron spectroscope (XPS, Escallab 250, Thermo Scientific, Waltham, MA, USA) with an Al-Kα line and a VG CLAMP hemispherical analyzer (Waltham, MA, USA).