The structure and crystallinity of the obtained pure and Ag-modified silica, pure curcumin, and capsaicin, as well as all drug delivery systems, were characterized by X-ray Powder Diffraction using Bruker D8 Advance diffractometerequipped with Cu Kα radiation and LynxEye detector (Bruker, Karlsruhe, Germany). The XRD patterns were collected within the range of 1–80° with a constant step of 0.02° and a counting time of 1 s/step.
Lynxeye
Manufactured by Bruker
Sourced in Germany, United States
The LynxEye is a high-performance X-ray detector developed by Bruker. It is designed to provide fast and efficient data collection in various X-ray diffraction applications. The LynxEye offers improved sensitivity and signal-to-noise ratio, enabling researchers to obtain high-quality data with reduced measurement times.
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Lab products found in correlation
D8 advance, by Bruker (16 mentions)
D2 phaser, by Bruker (14 mentions)
D8 advance diffractometer, by Bruker (2 mentions)
Gaia3, by TESCAN (1 mentions)
Axis 165, by Shimadzu (1 mentions)
D8 advance a25, by Bruker (1 mentions)
D8 diffractometer, by Bruker (1 mentions)
D8 discover, by Bruker (1 mentions)
Axs d8 advance, by Bruker (1 mentions)
Lynxeye xe, by Bruker (1 mentions)
D8 discovery, by Bruker (1 mentions)
39 protocols using lynxeye
1
Structural Characterization of Formulations
2
Quantitative X-ray Diffraction Analysis
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X-ray diffraction (XRD) patterns were recorded on a Bruker D8 Advance instrument using CuKα radiation and the Bragg-Brentano focusing geometry. The aperture of the Soller slits on the primary and reflected beams was 2.5°. LynxEye (Bruker) multi strip detector was employed for intensity measurements. Data acquisition was performed in the 2θ range of 15–100°, at a 0.05° step and counting time of 2 s. Phase analysis was carried out using the ICDD PDF 2 database (Powder Diffraction File PDF-2. International Center for Diffraction Data. USA. 2009). Structural data were taken from the structural database ICSD (Hellenbrandt, 2004 (link)). Rietveld refinement for quantitative analysis was carried out with the help of the software package Topas V.4.3 (Coelho, 2005 ). The instrumental broadening was described with metallic silicon as a reference material. The diffraction line profiles were analyzed using the fundamental parameter approach. The lengths of coherent scattering domain were calculated from LVol-IB values (i.e., volume weighted mean column lengths based on integral breadth).
3
Out-of-Plane XRD Characterization Protocol
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The XRD measurements for out-of-plane (co-planar orientation) were carried out using a Bruker D8-Advance diffractometer equipped with a position sensitive detector Lynxeye in geometry, variable divergence slit and 2.3° Soller-slit was used on the secondary side. The Cu-anodes which utilize the Cu Kα1,2-radiation (ʎ = 0.154018 nm) was used as source.
4
X-ray Diffraction Analysis of Copolymers
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The X-ray diffraction analysis of CS, PNIPAAm and synthesized copolymers were performed on the D8 Advance diffractometer (Bruker AXS, Karlsruhe, Germany) operating at the tube voltage of 40 kV and tube current of 40 mA. The X-ray beam was filtered with a Ni 0.02 mm filter to select the CuKα wavelength. Diffraction patterns were recorded in a Bragg–Brentano geometry using a fast-counting detector, a Bruker LynxEye, based on a silicon strip technology. The samples were scanned over the range 2θ = 3–70° at a scanning speed of 6° min−1 using a coupled two theta/theta scan type.
5
Nanoparticle Crystallographic Structure Analysis
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XRD measurements were applied to characterize the nanoparticle crystallographic structure. The small-angle parts of the XRD patterns were collected from 0.3 to 8° 2θ using a knife-edge antiscatter screen attachment of the primary beam. Patterns were obtained on the Bruker D8 Advance diffractometer with Cu Kα radiation and a LynxEye detector (Bruker Corporation, Karlsruhe, Germany).
6
Characterization of Cycled Solid-State Electrolytes
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Powder XRD results were obtained with a D8 Advance with LynxEye and SolX (Bruker, USA) using Cu Kα radiation. XPS was conducted on a high-sensitivity Kratos AXIS 165 x-ray photoelectron spectrometer using Mg Kα radiation. All binding energy values were referenced to the C 1s peak at 284.6 eV. The content of different species was obtained by fitting the whole XPS spectra using the CasaXPS software. The distributions of different elements in different depths of the cycled LPS SSEs were analyzed using a time-of-flight secondary ion mass spectroscope attached with a Ga+ focused ion beam (FIB)/scanning electron microscope (Tescan GAIA3). The accelerated voltage for FIB/SEM was 20 kV.
7
Powder X-ray Diffraction of Materials
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Routine powder X-ray diffraction was carried out on a Bruker D8 Advance A25 diffractometer using Cu Kα radiation equipped with a 1-dimensional position-sensitive detector (Bruker LynxEye). XR scattering was recorded between 4° and 90° (2θ) with 0.02° steps and 0.5 s per step (28 min for the scan). Divergence slit was fixed to 0.2° and the detector aperture to 189 channels (2.9°).
8
Powder XRD and FESEM Analysis
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The phase analysis was performed with powder XRD on a D8 Advance with LynxEye and SolX (Bruker AXS) using a Cu Kα radiation source operated at 40 kV and 40 mA. The morphology of the samples was examined by a field emission SEM (JEOL 2100F).
9
In Situ XRPD Crystallization Monitoring
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In situ XRPD data were collected using a homemade prototype diffractometer, In-SituX® [33 ]. This apparatus has an original goniometer with an inverted geometry (−θ/−θ) associated with a dedicated reactor equipped with a transparent bottom for X-rays. It serves to identify solids in suspension during the crystallization process (time and temperature dependent), without any sampling. The detector is an LYNXEYE (Bruker, Germany) and the beam (Ni filtered) comes from an X-ray tube with a copper anticathode.
10
X-ray Diffraction Analysis of Crystallite Sizes
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X-ray diffractograms were recorded on a D8 diffractometer (Bruker, Billerica, MA, USA), equipped with a CuKα source (1.54 Å) and a Bragg–Brentano θ–2θ geometry, between 7° and 80° with a variable slit V12, a step of 0.03°, and a scan speed of 1 s/point, except for the diffractogram of HAp obtained in diluted conditions that was recorded with a fast detector LynxEye (Bruker, Billerica, MA, USA) with a variable slit V12 and an exposition time of 1.67/step/canal. Crystallite sizes were calculated using the Scherrer equation. The diffraction peak at 2θ = 26°, corresponding to the plan (002), was used for the calculation due to its adequate resolution and absence of overlap with other peaks.
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