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Uv 1900 uv vis double beam spectrophotometer

Manufactured by Shimadzu
Sourced in Japan

The Shimadzu UV-1900 is a UV–Vis double-beam spectrophotometer. It measures the absorption of light by a sample over a range of ultraviolet and visible wavelengths.

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2 protocols using uv 1900 uv vis double beam spectrophotometer

1

Characterization of Polymer Nanocomposites

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The crystal structure and properties of the product polymer was determined using FTIR, XRD, Transmission electron microscopy (TEM), energy dispersive X-ray (EDX), scanning electron microscopy (SEM) and Atomic Force Microscopy (AFM). The type of bonding interactions and functional groups present in the nanocatalyst was determined via Fourier-transform infrared spectroscopy (FTIR) using a Perkin Elmer PE1600 spectrometer (Ramsey, MN, USA). FTIR analysis was conducted in the 400–4000 cm−1 frequency range with the transmission mode. A Rigaku Ultima 1V XRD diffractometer (Tokyo, Japan) was employed to assess the crystalline structure of the nanocomposites. TEM was used to determine the particle size of the nanocomposites. Here, the elemental size and dispensation of the nanocomposite materials in the blended polymer matrix were determined using a JEM 2100 electron microscope (Akishima, Tokyo, Japan). The surface morphological features, elemental identification, and both the chemical composition and homogeneity of AS-g-PAni@MS were determined via SEM combined with EDX–SEM; JEOL GSM 6510LV (Akishima, Tokyo, Japan). A Shimadzu UV-1900 UV–Vis double-beam spectrophotometer (Kyoto, Japan) was utilized to analyse aliquots of the CV samples after completion of the adsorption reaction.
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2

Characterization of Nanoparticle Synthesis

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Various characterization techniques are applied for nanoparticle synthesis and identification of crystal structure. The functional groups and type of bonding present in the synthesized product were observed by a Perkin Elmer spectrum 2 FTIR spectrometer. The surface morphology and shape of the nanocomposite material was observed by scanning electron microscopy (SEM, JEOL GSM 6510LV) and transmission electron microscopy (TEM, JEM 2100). The information about crystal phase and lattice structure and miller indices was evaluated by the X-ray diffraction method using a Rigaku Ultima 1V XRD spectrometer. The absorbance measurement was done through UV-1900 Shimadzu spectrophotometer. A Shimadzu UV-1900 UV-Vis double-beam spectrophotometer was used for taking the spectra of nanoparticles. The remaining concentration of Pb (II) after completion of the adsorption reaction was observed by atomic absorption spectrometer (AAS) GBC scientific instruments.
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