The crystalline structure of the sample was analyzed by X-ray diffraction (XRD) (Rigaku Mini Flex II, Japan) with Cu Kα radiation (30 kV, 15 mA, λ = 0.1542 nm). The scan range is 10°–80° at 2θ angles with a scan rate of 5° min−1. The morphology of as-prepared material was determined by scanning electron microscopy (SEM, Hitachi, SU8010) and transmission electron microscope (TEM, JEM-2100F) equipped with EDX (accelerating voltage of 200 kV). The X-ray photoelectron spectroscopy (XPS) was investigated on a Thermo Scientific ESCALAB 250Xi X-ray photoelectron spectrometer with a Monochromatic Al Kα (1486.6 eV) X-ray source. The UV-vis diffuse reflectance spectroscopy (UV-vis DRS) was measured on a UV-vis spectrophotometer (UV-1800) to evaluate the optical properties of the catalysts. Photoluminescence (PL) spectrum was assessed through a Hitachi F-4700 spectrophotometer. The electrochemical impedance spectroscopy (EIS) and photocurrent data were investigated via an electrochemical work station with a three-electrode cell (VersaSTAT-3, Ametek Princeton, USA) under 300 W Xe lamp irradiation. The Ag/AgCl electrode and Pt wire acted as the reference electrode and the counter electrode, respectively. The working electrode was obtained by the as-synthesized material coated on an ITO electrode. 0.5 M Na2SO4 solution was used as the electrolyte.
F 4700 spectrophotometer
Manufactured by Hitachi
Sourced in Japan
The F-4700 spectrophotometer is a laboratory instrument designed to measure the absorption or transmission of light by a sample. It operates in the ultraviolet, visible, and near-infrared wavelength ranges. The F-4700 provides precise and reliable data for various analytical applications.
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Lab products found in correlation
Silica gel, by Qingdao Haiyang Chemical (3 mentions)
Jem 2100f, by Hitachi (1 mentions)
Su8010, by Hitachi (1 mentions)
Miniflex 2, by Rigaku (1 mentions)
Axs d2 phaser, by Bruker (1 mentions)
Sta 449 f3 system, by Netzsch (1 mentions)
Escalab 250xi system, by Thermo Fisher Scientific (1 mentions)
Ftir 8400s spectrophotometer, by Shimadzu (1 mentions)
Escalab 250xi x ray photoelectron spectroscopy, by Thermo Fisher Scientific (1 mentions)
Jem 2100f microscope, by JEOL (1 mentions)
Xrd 6000 diffractometer, by Shimadzu (1 mentions)
Chi660e electrochemical workstation, by Chenhua (1 mentions)
Escalab xi system, by Thermo Fisher Scientific (1 mentions)
Dsa100, by Krüss (1 mentions)
Smartlab 9 kw diffractometer, by Rigaku (1 mentions)
Sta 449 f5, by Netzsch (1 mentions)
Vario el cube analyzer, by Elementar (1 mentions)
Tcs sp8 sr confocal microscope, by Leica camera (1 mentions)
5 protocols using f 4700 spectrophotometer
1
Comprehensive Characterization of Crystalline Materials
2
Comprehensive Materials Characterization Protocol
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KBr pellets were used to examine the FTIR spectra with a SHIMADZU FTIR-8400s spectrophotometer. A Bruker AXS D2 PHASER was employed to record XRD patterns with Cu Kα radiation. A NETZSCH STA 449F3 system was used to conduct TGA studies under air, with a heating rate of 10 °C/min up to 800 °C. SEM with a JSM-6701F system and TEM with a Tecnai F20 system equipped with EDX were used to analyze the morphologies and elemental distributions of the photocatalysts. A Micrometrics ASAP-2460 Surface Area and Porosimetry Analyzer was used to measure the BET-specific surface areas. A Thermo Fisher ESCALAB 250Xi system was used to obtain the XPS data. The PL spectra were obtained at room temperature with a Hitachi F-4700 spectrophotometer with an excitation wavelength of 350 nm. A CS310H electrochemical workstation was used to assess the electrochemical performance.
3
Comprehensive Characterization of Nanostructured Materials
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X-ray diffraction (XRD) analysis was implemented on a Shimadzu XRD-6000 diffractometer (Shimadzu, Shimadzu, Japan). High resolution transmission electron microscopy (HRTEM) characterization was completed on a JEM-2100F microscope (JEOL, Tokyo, Japan). The characterization of elements was carried out by a Thermo Scientific Escalab 250Xi X-ray photoelectron spectroscopy (Thermo, MMAS, USA). The UV–vis absorption spectra were tested on a UV-5500PC UV–visible spectrophotometer (Metash, Shanghai, China). F-4700 spectrophotometer was used to perform the fluorescence spectra (Hitachi, Tokyo, Japan). The zeta potential was estimated by NanoBrook Omni Brookhaven Instruments (BIC, Brookhaven, USA). The FT-IR characteristic measurement was carried out by L1600400 Spectrum Two infrared spectrometer (PerkinEImer, LIantrisant, UK). Electrochemical impedance spectroscopy (EIS) and cyclic voltammetry (CV) were carried out at the CHI 660E electrochemical workstation (Shanghai Chenhua Instrument, Shanghai, China).
4
Comprehensive Characterization of a Novel Material
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All chemicals were of analytical grade and used without further purification. Elemental analyses for C, H, and N were carried out on an Elementar vario EL cube analyzer. Infrared spectra were recorded on a Nicolet-5700 FT-IR spectrophotometer with KBr pellets. Powder X-ray diffraction (PXRD) patterns were recorded on a Rigaku SmartLab 9 kW diffractometer with Cu Kα radiation (λ = 1.5418 Å) at room temperature. Thermogravimetric analyses (TGA) were performed under the nitrogen atmosphere on a Netzsch STA 449F5 thermal instrument. Adsorption isotherms for water vapor were measured with an Hiden intelligent gravimetric sorption analyzer at 298 K. The contact angle toward water was recorded with Krüss DSA 100S instrument. X-ray photoelectron spectroscopy (XPS) were performed on a Thermo Fisher Scientific Escalab Xi+ system. The absorption spectra were recorded on a Persée T9CS UV-Vis spectrophotometer. The photoluminescence spectra were measured on a Hitachi F-4700 spectrophotometer.
5
Spectroscopic Characterization of Novel Compounds
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All reagents and chemicals were purchased from commercial suppliers and used without further purification. Ultrapure water was prepared through the Sartorious Arium 611DI system and used throughout the experiments. Thin-layer chromatography (TLC) analysis was performed on Silica gel plates (F254, Merck KGaA (Darmstadt, Germany)). Silica gel (200–300 mesh, Qingdao Haiyang Chemical Co. (Qingdao, China)) was used for column chromatography. All NMR data were taken on a 400 MHz spectrometer (Bruker Co., Lt.d, Germany (Darmstadt, Germany)). All chemical shifts are reported in ppm values using the peak of TMS as an internal reference. Fluorescence emission spectra were obtained on a HITACHI-F4700 spectrophotometer. Absorbance spectra were recorded on a SP-2500 UV−vis spectrophotometer (Shanghai spectrum). Fluorescence images were acquired by a Leica TCS-SP8 SR confocal microscope, and images were generated using ImageJ software.
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