For SEM analysis, the seeds were mounted onto aluminum stubs using carbon tape and coated with a thin layer of platinum using a Gatan 682 Precision Etching and Coating System (Gatan Inc. Pleasanton, CA, USA). The samples were imaged by a JSM-7600F Schottky field emission SEM (Jeol Ltd., Tokyo, Japan), and the representative images are shown.
Jsm 7600f schottky field emission sem
Manufactured by JEOL
Sourced in Japan
The JSM-7600F is a Schottky field emission scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging capabilities for a wide range of applications. The JSM-7600F utilizes a Schottky field emission gun to generate a high-brightness electron beam, enabling the acquisition of high-quality images at low accelerating voltages.
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Lab products found in correlation
2 protocols using jsm 7600f schottky field emission sem
1
SEM Analysis of Plant Seeds
2
SEM Analysis of Garlic Microstructure
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For SEM analysis, pieces of approximately 4 mm × 4 mm in size and 1 mm in thickness were excised from the surface of treated and untreated cloves while using a scalpel and then freeze dried. The samples were attached onto aluminum stubs using conductive carbon tape and coated with a thin layer of platinum using a Gatan 682 Precision Etching and Coating System (Gatan Inc., Pleasanton, California). The SEM images were obtained using a JSM-7600F Schottky Field Emission SEM (Jeol Ltd., Tokyo, Japan).
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