XPS measurements are performed with a Perkin Elmer 5300 XPS system with a non-monochromatized Mg-Kα X-ray source. Calibration is performed using the C-1s component (binding energy of 284.6 eV). An Mg-Kα X-ray is used with 300 W applied to the anode. For the XPS peak deconvolution, the XPS Peak 4.1 software is used, while Shirley background is employed to subtract the background.
Tecnai g20
The Tecnai G20 is a transmission electron microscope (TEM) produced by Thermo Fisher Scientific. It is designed to capture high-resolution images and perform advanced analytical techniques on a wide range of materials. The Tecnai G20 utilizes a field emission gun (FEG) as the electron source and features advanced optics and imaging capabilities.
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137 protocols using tecnai g20
Comprehensive Material Characterization Protocol
XPS measurements are performed with a Perkin Elmer 5300 XPS system with a non-monochromatized Mg-Kα X-ray source. Calibration is performed using the C-1s component (binding energy of 284.6 eV). An Mg-Kα X-ray is used with 300 W applied to the anode. For the XPS peak deconvolution, the XPS Peak 4.1 software is used, while Shirley background is employed to subtract the background.
Synthesis and Characterization of Mesoporous Bioactive Glass
The morphology and microstructure of the synthesized MBG were studied utilizing transmission electron microscopy (TEM, Tecnai G-20, FEI, Hillsboro, OR, USA) equipped with an energy dispersive spectrometer (EDS, Oxford Inca Energy 350, Oxford Instruments, Abingdon, UK) at 200 kV. The phase structure analysis of MBG was conducted using an X-ray diffractometer (XRD, Bruker, D8 Advance, Berlin, Germany) with Cu Kα radiation and at a step size of 5°/min. The surface area and pore size distribution were evaluated using the nitrogen adsorption–desorption technique at 77 K.
Structural Characterization of Materials
Morphological Characterization of Nano.Alg and MFS.Alg
Characterization of Tb4O7 Nanoparticles
Characterization of Pd/alk-Ti3C2X2 Catalyst
Characterization of V2O5/Graphene Composites
Electrochemical Characterization of Catalysts
Thermal Characterization of Paraffin-AP25/Composite PCM
X-ray diffraction (XRD) was measured using an XRPhillipsX’pert (MPD3040) X-ray diffractometer supported by a monochromatic Cu Ka source (k = 1.5406°A) to characterize the prepared composite. The measurement was conducted in the step-scan mode and taken every 0.02° in the range from 20 to 80°. Transmission electron microscopy was conducted using a JEM-2100 instrument to investigate the morphology of the composite (type Tecnai G20, FEI). Further, samples were explored and imaged using a field-emission scanning electron microscope (SEM) (FE-SEM, Quanta FEG 250), and the main elements contained in the images of catalyst samples were assessed via examination of the energy-dispersive spectrum (EDX).
Characterization of BaTiO3 Nanoparticles
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