Hq nsc18 pt

The probe-induced hydrogenation and conductivity mapping measurements were performed by a commercial SPM setup (Cypher ES, Oxford Instruments) equipped with temperature and gas environmental control accessories and Pt-coated conductive cantilevers (HQ:NSC18/Pt, MikroMasch, tip radius is ~30 nm). All the writing, erasing and reading experiments are conducted with an orca tip holder at room temperature. Under the orca module, the current measurement range is ±10 µA and the sensitivity is about 1 pA. All conducting atomic force microscope mapping measurements were conducted with a reading voltage of 0.1 V. To eliminate the influence of “water writing”, the sample stage was first heated up to 120 °C with flowing argon gas for 30 min. After cooling down to room temperature, the SPM chamber was flushed by the forming gas (5% hydrogen/95% Ar) for 30 min. Finally, a continued forming gas flow was maintained during the hydrogenation process. The writing/erasing/reading voltage in this work describes the potential of the tip relative to the substrate.

Magnetic properties were analyzed using a Quantum Design MPMS-3 SQUID magnetometer and a Digital Measurement System 7035B vibrating sample magnetometer. In the SQUID magnetometer out-of-plane M–H measurements were performed on a 2 mm × 2 mm YFO film sample mounted on a semicylindrical quartz holder, while in-plane measurements were performed on a 4 mm × 4 mm sample, yielding a higher signal to noise ratio. A Precision Premier II Ferroelectric Tester was used to perform the P–E loops and PUND measurements with a home-made probe station. SS-PFM, PFM, and SKPFM measurements were performed on a commercial atomic force microscope (Cypher, Asylum Research) under dual-frequency resonant tracking modes with Pt-coated Si conductive probes (MikroMasch, HQ:NSC18/Pt).

The scanning probe microscopy (SPM) measurements, including morphology, local current and surface potential characterizations, were performed by a commercial scanning probe microscope (Cypher ES, Oxford Instruments), which was armed with Pt-coated conductive cantilevers (HQ: NSC18/Pt, MikroMasch) with a spring constant of ~2.8 N/m and a free resonance frequency of ~75 kHz. The conducting atomic force microscope (c-AFM) measurements were conducted to probe the local conductivity of the samples, in which the orca tip holder was selected. All conducting atomic force microscope mapping measurement were conducted with reading voltage of 0.8 V.