The shape of the sample was analyzed using field-emission scanning electron microscopy (SUPRA25; Carl Zeiss, Oberkochen, Germany). x-ray diffraction (XRD) patterns were acquired by an Ultima IV multipurpose XRD system (Rigaku, The Woodland, TX, USA) at 40 kV and 40 mA, with a scanning speed of 0.1°/min.
Ultima 4 multipurpose xrd system
Manufactured by Rigaku
Sourced in United States
The Ultima IV multipurpose XRD system is a versatile X-ray diffraction instrument manufactured by Rigaku. It is designed to perform a wide range of X-ray diffraction analyses. The Ultima IV system features advanced optics and components to provide accurate, high-quality data.
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Lab products found in correlation
5 protocols using ultima 4 multipurpose xrd system
1
Structural Analysis of Nanomaterials
2
Characterization of Synthesized Dense BGN and MBGN
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The synthesized dense BGN and MBGN were characterized as follows. The crystalline phase was determined via x-ray diffraction (XRD) analysis using 40 kV, 40 mA Cu-Kɑ radiation, and an X-ray diffractometer (Ultima IV multipurpose XRD system, Rigaku, The Woodland, TX, USA). XRD analysis was performed with a scanning speed of 4°/min and 2θ range of 10–70° for wide-angle XRD patterns, and with a scanning speed of 1.2°/min and range of 0.5–10° for small-angle XRD patterns. Functional groups and chemical composition were examined via Fourier-transform infrared spectroscopy (FTIR) analyses using a Nicolet 5700 spectrometer (Thermo Scientific Inc., Madison, WI, USA). Information about N2 adsorption-desorption isotherms was obtained at 77 K using an ASAP 2420 gas adsirotuib analyzer (Micromeritics, Atlanta, GA, USA). Specific surface area and pore size distribution were calculated via the BET and BJH method, respectively. The topography of the sample was observed and analyzed with field emission scanning electron microscopy (FESEM) (Sigma, Zeiss, Germany).
3
X-Ray Diffraction and FT-IR Analysis
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X-ray diffraction patterns were obtained using an Ultima IV multipurpose XRD system (Rigaku, The Woodland, TX, USA) at 40 kV and 40 mA, with a scanning speed of 0.1°/min. Functionalized surfaces were investigated using the ATR method of FT-IR; specifically, the Spectrum GX FT-IR Spectrometer (PerkinElmer Inc., Waltham, MA, USA) was used.
4
Characterization of Graphite Nanostructures
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The morphology and microstructure of as-prepared samples were examined by optical microscopy (OM, Nikon LM 2), and analyzed by field emission scanning electron microscopy (SEM, JEOL JSM 6510A) and high resolution transmission electron microscopy (HRTEM, FEI Tecnai G2 F20 S-Twin). Raman spectra of the raw graphite strip and recovered samples were recorded on a LabRAM Aramis Raman spectrometer with a He-Ne laser at an excitation wavelength of 633 nm. The corresponding XRD patterns were recorded on an X-ray diffractometer (XRD) (Rigaku Ultima IV multipurpose XRD system) with Cu Kα radiation (λ = 0.15406 nm) at a step size of 0.05° (2θ) and a step scan time of 1.0 s. The sample suspensions were dropped on a Si plate and dried at room temperature for optical microscopic, SEM and Raman spectroscopic analysis. The sample suspensions were also dropped and dried on a copper mesh grid for TEM analysis. The atomic force microscopy (AFM) analysis was taken by MFP-3D Infinity AFM.
5
Bioactivity Assessment of Resin Disks
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The resin disks were immersed in simulated body fluid (SBF) at 37 °C for 28 days to assess their non-cellular bioactivity. Images of resin disk surfaces were obtained using SEM (MIRA3, Tescan, Brno, Czech Republic) to examine the surface morphology of the resin disks before and after immersion in the SBF. X-ray diffraction (XRD) spectroscopy was performed using an Ultima IV multipurpose XRD system (Rigaku, The Woodland, TX, USA) at 40 kV and 40 mA, with a scanning speed of 0.1°/min, on the disk surfaces [40 (link),41 (link)].
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