Crystalline phases of the synthesized NPs were analyzed by Rigaku MiniFlex X-ray diffractometer (XRD, Tokyo, Japan) with Cu Kα (λ 1.540593 Å) radiation in the scan range 5–90°. The morphology and size of synthesized NPs were characterized using a scanning electron microscope (SEM, Lyra, Tescan and Helios 5UX, FEI, Eindhoven, Netherland) and transmission electron microscopy (TEM, Tecnai F20, FEI, Eindhoven, Netherland). Average hydrodynamic diameter (dh) and zeta (ζ) potential of NPs (50 mg/L) in DI water and 2% NaCl solution were measured using Zetasizer Nano ZS (Malvern Instruments Ltd, Worcestershire, UK). The dh and ζ-potential were measured in 1mL DTS1061 folded capillary cell (Malvern Instruments, Worcestershire, UK) immediately after preparation (0 h) and after 24 h. Attenuated total reflection–Fourier transform infrared (ATR-FTIR, Varian 800 FT-IR, Scimitar Series, Fitchburg, WI, USA) measurements were recorded on a Attenuated Total Reflectance (ATR, GladiATRTM, Pike technologies, Fitchburg, WI, USA) mode in the range of 4000 to 400 cm−1 at a resolution of 4 cm−1 after 50 continuous scans.
Helios 5 ux
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Helios 5 UX is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis. It features a field emission electron source and a high-performance, stable electron optics system to provide high-resolution imaging capabilities. The Helios 5 UX is capable of operating at low accelerating voltages and offers a wide range of imaging and analytical modes to support various applications in materials science, nanotechnology, and related fields.
Automatically generated - may contain errors
Lab products found in correlation
Autotem 5, by Thermo Fisher Scientific (2 mentions)
Miniflex x ray diffractometer, by Rigaku (1 mentions)
Tecnai f20, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Gladiatr, by PIKE Technologies (1 mentions)
Hf5000, by Hitachi (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Uv visible spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Eos 80d camera, by Canon (1 mentions)
D8 advance powder x, by Bruker (1 mentions)
S 4800 fesem, by Hitachi (1 mentions)
Super x, by Thermo Fisher Scientific (1 mentions)
Talos f200x, by Thermo Fisher Scientific (1 mentions)
K alpha system, by Thermo Fisher Scientific (1 mentions)
Talos f200x g2, by Thermo Fisher Scientific (1 mentions)
S 4800, by Hitachi (1 mentions)
Smartlab, by Rigaku (1 mentions)
Dsc 404 f3, by Netzsch (1 mentions)
Verios 5 uc, by Thermo Fisher Scientific (1 mentions)
D8 discover, by Bruker (1 mentions)
12 protocols using helios 5 ux
1
Characterization of Synthesized Nanoparticles
2
Focused Ion Beam Specimen Preparation for TEM
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The samples for transmission electron microscopy were prepared by focused ion beam (Helios 5 UX, FEI), using an Ar ion beam first at the voltage of 30 kV and the current of 2.4 nA and then, at the voltage of 2 kV and the current of 50 pA to avoid strong ion-beam damage. The dark-field (DF) images and selected-area electron diffractions (SAED) were acquired on a transmission electron microscope (JEM-2100F, JEOL, Japan) at 200 kV. The atomic-scale STEM HAADF images were acquired on a probe corrected transmission electron microscope (HF5000, Hitachi, Japan, at 200 kV). The convergence semi-angle is 20 mrad. The probe size is in UHR mode and the collection semi-angle is 60–320 mrad.
3
Comprehensive Characterization of Synthesized AgNPs
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The UV/visible absorption spectra were gathered from UV/visible spectrophotometer (Thermo-Fisher). Quartz cuvette of 1 cm path length were used as sample cell. The SEM image was obtained from a focused ion beam scanning electron microscope (FIB-SEM) with STEM detector at primary 30 kV (Helios 5 UX, from Thermo Fisher Scientific). The XRD patterns of the synthesized AgNPs was collected from a D2 phaser XRD-300 W powder diffractometer (Bruker, AXS GmbH, Karlsruhe, Germany). SERS spectra were collected using the Horiba Labram Raman spectrometer of 532 nm laser line (JDS Uniphase Corporation, Milpitas, CA) and a CCD detector (Jobin-Yvon, Inc.). A Bruker FTIR spectrometer (specs (vertex 70v vacuum FTIR)) was used to collect the IR spectra.
4
Characterization of Colorful Thin Films
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Optical photos and videos were captured using a Canon EOS 80D camera. SEM images were obtained using an S‐4800 FE‐SEM (Hitachi, Japan) at an acceleration voltage of 5 kV, and cross‐sectional images of the samples were obtained by cutting with a precision cross‐sectional system (Ilion+, Model 693, Gatan) under the protection of liquid nitrogen. To expose the cross‐sectional surface, the colorful films were prepared using a focused ion beam (FIB) microscope (FEI; Thermo Scientific Helios 5UX, USA). Morphological and EDS analyses of the samples were performed using a Tecnai G2 F20 S‐Twin TEM. XPS was performed by an ESCALAB 250Xi XPS instrument with Al‐Kα X‐ray as the excitation source. XRD patterns were recorded on a Bruker D8 Advance powder X‐ray diffractometer at a scanning rate of 4° min−1 using Cu–Kα radiation (λ = 1.54056 Å).
5
FIB-TEM Lamellae Preparation and Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
TEM lamellae were prepared by FIB (Helios 5 UX, Thermo Fischer Scientific) using AutoTEM 5 (Thermo Fischer Scientific). Carbon deposition was used to protect the surface. The chunk milling and lamellae thinning were done at 30 kV with an FIB current from 20 nA to 90 pA. Then the lamellae were polished at 5 kV and finished at 2 kV. TEM characterisation was performed on a TEM (Talos F200X, Thermo Fischer Scientific) operating at 200 kV. EDS mapping was acquired by using quadrant EDS detectors (Super-X, Thermos Fisher Scientific, the Netherlands) in STEM mode.
6
Automated FIB/SEM Workflow with AutoTEM 5
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
We used an FIB/SEM (Helios 5 UX, Thermo Fisher Scientific) with the latest automation software (AutoTEM 5, Thermo Fisher Scientific). A motorized manipulator (EasyLift, Thermo Fisher Scientific) is integrated with the FIB/SEM and controlled via AutoTEM 5 software. Detail workflow of AutoTEM 5 is explained in the main text and Supplementary Methods .
7
Focused Ion Beam Milling of Laser Facets
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The focused ion beam (FIB) milling technique is conducted using the Helios 5 UX (Ga ion) manufactured by ThermoFisher and maintained by ScopeM, ETH Zurich. For each facet, the FIB milling is used in two steps: before the deposition of the coating, alignment markers are milled by FIB on the laser facet about 20 μm away from the laser waveguide. After the coating deposition, the circular aperture is milled through the metallic layer with the help of the markers. The milling stops at the interface between the Al2O3 and Au layers. In the end, the alignment between the aperture and the waveguide is checked by a high-resolution scanning electron microscope (SEM) or energy-dispersive X-ray spectroscopy (EDX). Further details and images are shown in the Supplemental Material, Sec. C .
8
Multi-Technique Material Characterization Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
X-ray diffraction (XRD) was performed on the Rigaku SmartLab instrument with copper Kα radiation at a scan rate of 10° min−1. Scanning electron microscope (SEM) images and energy dispersive spectroscopy (EDS) were collected by Hitachi S4800. X-ray photoelectron spectroscopy (XPS) was conducted on a Thermo Scientific K-Alpha+ system with an Al-Kα source. The time-of-flight secondary ion mass spectrometry (TOF-SIMS) was performed on the IONTOF GmbH 5-100 instrument under the positive ion mode. A focused ion beam scanning electron microscope (FIB-SEM, Helios 5 UX, ThermoFisher SCIENTIFIC) with a cryo-stage was used to fabricated the lamella of the LACSS. Then, transmission electron microscopy (TEM) was conducted on Talos F200X G2 (ThermoFisher SCIENTIFIC) with a cryo-stage. All the samples were transferred to the sample holder within the Ar atmosphere.
9
Fracture Surface Morphology Analysis of 3D Printed Ultem Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology of the fracture surfaces for the transverse cross-sections of the Ultem samples printed in the X, Y, and Z directions was examined using a conventional complementary metal–oxide–semiconductor (CMOS) camera with a built-in 5× zoom lens and by high-resolution SEM-FIB electron microscope (Helios 5 UX; Thermo Fisher Scientific, Waltham, MA, USA) operated at 0.5 kV and 25 pA with scan interlacing and integration to avoid charging. Optical microscopy and scanning electron microscopy (SEM) were employed to relate the corresponding macrostructure to the mechanical performance of the material along the printing directions. The specimens were used after testing their tensile properties without further modification.
10
Thermal and Structural Analysis of Amorphous Powders
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The thermal properties of amorphous powders were analyzed using differential scanning calorimetry (DSC, Netzsch DSC 404 F3) at a heating rate of 20 K/min, and the onsets of glass transition temperature (Tg) and crystallization temperature (Tx) were identified by the tangent method. The structures of powders were examined by X-ray diffraction (XRD, Bruker D8 Discover) using Cu-Kα radiation. The morphology was characterized by scanning electron microscopy (SEM, Thermo Fisher Verios 5UC). Furthermore, the structural features at the nanoscale were investigated by a spherical aberration-corrected transmission electron microscopy (TEM, Thermo Fisher Spectra 300). A focused ion beam (FIB, Thermo Fisher Helios 5UX) was used to prepare the TEM samples. Further energy-dispersive X-ray spectroscopy (EDS) analysis was conducted using Thermo Fisher Scientific’s Super-X windowless EDS detector at an acceleration voltage of 300 kV. Electron energy loss spectroscopy (EELS) was used to analyze the hydrogen in the sample.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!