Auriga field emission sem
The Auriga field-emission scanning electron microscope (FE-SEM) is a high-performance imaging and analysis tool designed for advanced materials characterization. It features a high-brightness field emission electron source, delivering high-resolution imaging capabilities across a wide range of accelerating voltages. The Auriga FE-SEM is a versatile platform that enables comprehensive sample analysis and visualization at the nanoscale.
Lab products found in correlation
6 protocols using auriga field emission sem
Microscopic Analysis of tGFRP Cross-section
Microscopic Analysis of Material Samples
Nanocomposite Morphology Investigation
Bacterial Cell Morphology and Propagation Characterization via SEM
Immature DCs Platelet Adhesion SEM
Cryo-SEM Visualization of CMF Structures
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