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Bx53 polarizing microscope

Manufactured by Olympus
Sourced in Japan

The BX53 polarizing microscope is a high-performance optical microscope designed for materials science and research applications. It features a sturdy, ergonomic design and advanced optics that enable precise observation and analysis of samples using polarized light. The BX53 provides consistent, reliable performance for a wide range of applications.

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2 protocols using bx53 polarizing microscope

1

Rheological and Microscopic Analysis

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The SP and POM photos of pitches were determined and observed by a CFT−100EX capillary rheometer (Shimadzu, Kyoto, Japan) and a BX53 polarizing microscope (Olympus, Tokyo, Japan).
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2

Characterization of chiral liquid crystal GNRs

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Transmission electron microscopy (TEM) analysis was performed with a FEI Tecnai TF20 TEM instrument at an accelerating voltage of 200 kV. Samples were prepared by evaporating a drop of dilute GNR solutions in chloroform onto carbon-coated copper TEM grids (400 mesh, TED PELLA, Inc.), which were allowed to dry for 24 h prior to imaging. Freeze-fracture TEM (FF-TEM) images were obtained either on a FEI Tecnai TF30 ST TEM instrument at an accelerating voltage of 300 kV or a JEOL JEM-100S at 100 kV. The FF-TEM samples, replicas of fractured surfaces of the LC-GNR composites, were prepared following a procedure described elsewhere51 (link). UV-Vis absorption and solution circular dichroism (CD) spectropolarimetry measurements were done using an OLIS spectrophotometer (1 cm path length quartz cuvettes). 1H NMR spectra were recorded in CDCl3 on a Bruker DMX 400 MHz spectrometer and referenced internally to residual solvent peaks at 7.26 ppm. Polarized optical microscopy (POM) observations of the induced chiral nematic liquid crystals (N*-LCs) were recorded and photographed using an Olympus BX-53 polarizing microscope equipped with a Linkam LTS420E heating/cooling stage. Differential scanning calorimetry (DSC) was performed using a Pyris 1 DSC instrument (Perkin Elmer). Thermogravimetric analysis (TGA) was performed using a TGA Q500 (TA Instruments).
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