Fei nova nanosem 450tm
The FEI Nova NanoSEM 450TM is a high-resolution scanning electron microscope (SEM) designed for advanced materials characterization. It features a field-emission electron source, providing high-brightness and high-resolution imaging capabilities. The instrument can operate at low voltages, enabling the examination of delicate samples with minimal charging or beam damage effects.
Lab products found in correlation
2 protocols using fei nova nanosem 450tm
Scanning Electron Microscopy of Samples
Scaffold Morphology Characterization by SEM
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