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Fei nova nanosem 450tm

Manufactured by Thermo Fisher Scientific
Sourced in Germany

The FEI Nova NanoSEM 450TM is a high-resolution scanning electron microscope (SEM) designed for advanced materials characterization. It features a field-emission electron source, providing high-brightness and high-resolution imaging capabilities. The instrument can operate at low voltages, enabling the examination of delicate samples with minimal charging or beam damage effects.

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2 protocols using fei nova nanosem 450tm

1

Scanning Electron Microscopy of Samples

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A FEI Nova NanoSEM 450TM scanning electron microscope (Thermo Fisher, Frankfurt, Germany) was employed to examine the morphology and particle size of the samples using a 10 kV beam voltage. Prior to analysis, the samples were deposited on carbon tape and coated with a 10 nm thick gold layer using the Cressington 208HR Metalliser in order to improve their conductivity.
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2

Scaffold Morphology Characterization by SEM

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A FEI Nova NanoSEM 450TM scanning electron microscope (Thermo Fisher, Frankfurt, Germany) with an accelerating voltage of 30 kV was employed to examine the morphology of the scaffolds. Previously to their analysis, the samples were coated with a 10 nm thick gold layer in order to improve their conductivity. Crossed sections of each polymer were selected for their visualization.
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