Gemini 500 sem
The Gemini 500 SEM is a scanning electron microscope (SEM) developed by Zeiss. It is designed for high-resolution imaging and analysis of a wide range of materials. The Gemini 500 SEM utilizes advanced electron optics and detectors to provide detailed information about the surface topography and composition of samples.
4 protocols using gemini 500 sem
Fiber Characterization via Multimodal Analysis
Nanoparticle-Coated Wafer Characterization
coated
with a nanoparticle layer were used without further modification.
SiC monoliths were carefully broken to observe the inner pores after
coating. Cross-sectional samples of inverse opals were fabricated
by breaking the substrate along the crystal plane of the wafer using
a diamond cutter only in the corners.
Nanomaterial Structural Characterization by SEM and TEM
Characterizing Carbon Nanotube Morphology
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