Model su 70
The Hitachi Model SU-70 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It provides a magnification range from 25x to 800,000x, enabling detailed observation of surface topography and microstructural features. The SU-70 is equipped with state-of-the-art electron optics and advanced detectors to deliver exceptional image quality and analytical capabilities.
Lab products found in correlation
3 protocols using model su 70
Comprehensive Material Characterization Protocol
SEM Analysis of Titanium Disc Biofilms
Scanning Electron Microscopy of Microbes
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