AFM imaging was performed using a Nanosurf FlexAFM with two compatible scan heads either for large-area imaging up to 100 μm2 (Fig. 2 ) or for higher resolution (Fig. 2–5 ). In both cases Tap150Al-G cantilevers (Budget Sensors) with a force constant of 5 N m–1 operating in tapping mode have been used. For AFM data visualization and analysis the software Gwyddion 2.34 (freeware) was used.
Flexafm
Manufactured by Nanosurf
Sourced in Switzerland, Germany
The FlexAFM is an atomic force microscope (AFM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides precise topographical information about sample surfaces by scanning a sharp probe across the sample and detecting the interactions between the probe and the surface. The FlexAFM is capable of operating in various modes, including contact mode, tapping mode, and non-contact mode, to accommodate a wide range of sample types and applications.
Automatically generated - may contain errors
Lab products found in correlation
Easyscan 2 controller, by Nanosurf (2 mentions)
Tap190al g, by Budget Sensors (1 mentions)
Ecm670, by Merck Group (1 mentions)
Matlab r2022b, by MathWorks (1 mentions)
Tap190al g, by Nanosurf (1 mentions)
Axiovert 40 microscope, by Zeiss (1 mentions)
Cs 2000, by Konica Minolta (1 mentions)
Phi 5000 versaprobe, by Physical Electronics (1 mentions)
Cary 1e, by Agilent Technologies (1 mentions)
Talos f200x, by Thermo Fisher Scientific (1 mentions)
Ppp mfmr, by Nanosensors (1 mentions)
Quanta 200 microscope, by Thermo Fisher Scientific (1 mentions)
Axs d8 diffractometer, by Bruker (1 mentions)
Vector 22 spectrometer, by Bruker (1 mentions)
Tap150al g, by Budget Sensors (1 mentions)
Cam 200 optical contact angle meter, by Biolin Scientific (1 mentions)
Ultrapure water, by Merck Group (1 mentions)
Tap150 al g cantilever, by Budget Sensors (1 mentions)
Cb 340, by Zeiss (1 mentions)
Ft ir c89391, by PerkinElmer (1 mentions)
36 protocols using flexafm
1
Atomic Force Microscopy Imaging Protocol
2
Atomic Force Microscopy Evaluation of Surface Alterations
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A sample of the specimens (n = 1) from each group was analyzed under an atomic force microscope (FlexAFM—NanoSurf AG, Liestal, Switzerland, with C3000 controller with ADC and 24-bit DAC), before (Baseline and Biofilm) and after corrosion testing (Baseline and Biofilm). The analysis provided the area of each specimen, as mentioned in Section 3.1 , indicating the real area (considering the peaks and valleys) captured by the alteration of the surface of the specimens. The measurements were performed in tapping mode (Dynamic Force) at a rate of 0.5–1 Hz. The tips used were Tap190Al-G-10 (BudgetSensors, Sofia, Bulgaria) with a radius of less than 10 nm. The cantilever used has a force constant of 48 N/m with a resonance frequency of 190 kHz (nominal values provided by the manufacturer). The scanned area was 50 µm × 50 µm with a resolution of 512 × 512 pixels. The images and topographic parameters were analyzed with the aid of the Gwyddion software (version 2.55, Czech Metrology Institute, Brno, Czech Republic). The background of the slopes was fixed and, subsequently, standardized three-dimensional (3D) images were obtained on the z-axis scale to enable a visual comparative analysis between the groups.
3
Atomic Force Microscopy Protocols
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Atomic force microscopy (AFM) micrographs were recorded with a Nanosurf FlexAFM instrument, using silicon AFM probes with a resonance frequency of 190 kHz and a force constant of 48 N m−1 (Tap190AL-G, Budgetsensors).
4
Gelatin Coating Preparation on ERISM Substrates
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Gelatin coatings on ERISM substrates were prepared using a commercial assay (Millipore ECM670) following the manufacturer’s instructions, except that during the washing steps, the ERISM substrate was not allowed to fall completely dry to prevent damage to the surface. To still ensure complete removal of the previous reagent, the number of washing steps was increased from 3 to 6. Moreover, the chamber was washed twice with each reagent before incubation to minimize dilution of the reagent by the previously present liquid. The thickness of the gelatin coating on gold was determined with an AFM (Nanosurf, FlexAFM).
5
Topography and Adhesion Analysis of Titanium
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The surface topography of both groups was analyzed by scanning electron microscopy (SEM) (n = 2) and the surface topography was additionally characterized by intermittent contact mode atomic force microscopy (AFM) (Flex-AFM, Nanosurf AG; Liestal, Switzerland) (n = 2) [28 ]. AFM measurements were performed in ambient conditions with super sharp SSS-NCL cantilever from Nanosensors. The frequency, the spring constant and tip radius of curvature were equal to: f = 170 kHz, k = 35 N/m and R = 2 nm, respectively. The direct measurements of the adhesion forces were performed in contact mode AFM [29 (link)]. Soft contact mode PPP-Cont cantilever from Nanosensors was used, with spring constant equal to k = 0.3 N/m. The adhesion measurements were performed at 50 sample spots characterized by different topography features. To statistically average adhesion forces between titanium surfaces and silicon, 50 force-distance curves were acquired on each MD and ND sample, characterized by different topography features. Ten force-distance curves were acquired on each sample spot.
6
Nanoindentation Analysis of Human Nail Mechanics
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Nanoindentation is a suitable tool for locally measuring the Young's modulus of a sample and is widely used in the mechanical characterization of human nails.
16 (link),
17 In this study, an atomic force microscope (FlexAFM, Nanosurf) and a cantilever with a cone‐shaped probe tip (Tap190A1‐G, BudgetSensors) were used for nanoindentation. The experimental procedure for determining the Young's modulus of each plate by nanoindentation was the same as that used in our previous study.
12 (link) The force curve while pulling the probe up was recorded to determine the Young's modulus of each plate. From the obtained relationship between the force (PI) and displacement (δI), the Young's modulus at the point was determined using Equations(A5 )–(A7 ) based on the Hertzian model (see Appendix A3 ). In this study, the ν value for the nail samples was assumed to be 0.30.
18 (link)
16 (link),
17 In this study, an atomic force microscope (FlexAFM, Nanosurf) and a cantilever with a cone‐shaped probe tip (Tap190A1‐G, BudgetSensors) were used for nanoindentation. The experimental procedure for determining the Young's modulus of each plate by nanoindentation was the same as that used in our previous study.
12 (link) The force curve while pulling the probe up was recorded to determine the Young's modulus of each plate. From the obtained relationship between the force (PI) and displacement (δI), the Young's modulus at the point was determined using Equations
18 (link)
7
Dynamic AFM Imaging in Liquid
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AFM was performed with a commercial instrument (Nanosurf FlexAFM, Nanosurf, Switzerland). All imaging was performed under liquids (PBS). The images were recorded in dynamic mode with a Multi75Gd-G type probe. The recorded images were evaluated by the Gwyddion software.
8
Surface Roughness Analysis by AFM
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The surface was evaluated with atomic force microscopy (AFM) (Nanosurf FlexAFM, Liestal, Switzerland) to consider average roughness (Ra) and maximum roughness height within a sample length (Rmax) area of 80 × 80 µm using the tapping mode according to ISO 4287:1997: Geometrical products specifications-surface texture: Profile method.
9
Electrical Stimulation and AFM Force Measurements of Cells
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We used a FlexAFM (Nanosurf AG, Liestal, Switzerland) with inbuilt temperature controller and an inverted Axio Observer (Carl Zeiss, Jena, Germany) microscope for these measurements with Nanosensors qp-SCONT-10 microcantilever probes with a spring constant of ~0.01 N/m, and tip height of 8 µm. Once the microcantilever made contact with the cell, an AFG-2005 Arbitrary function generator (GW INSTEK) was used to electrically stimulate the cells (Figure 1 ) with carbon electrodes that were connected to the function generator. The cells were paced at different consecutively increasing frequencies with a 5 V electrical stimulation of 150 µs duration. After a 30-s period for the cells to acclimate to each pacing frequency, this was followed by a 30-s measurement period to collect data on force measurements. The microcantilever was used to measure both normal and lateral forces (Figure 1 ). The data were extracted with the Nanosurf 1.5.0 python package (Supplementary Materials , Figures S1 and S2 ). Subsequent data analysis was carried out using MATLAB R2022B (1994–2023 The MathWorks, Inc., Natick, MA, USA).
10
Characterization of Particle Morphology
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The shape, size, and aggregation phenomena of blank particles were investigated by atomic force microscopy (AFM) (Nanosurf FlexAFM (Nanosurf AG, Liestal, Switzerland)). The particles were redissolved in distilled water and the sample suspension was deposited on a freshly cleaned microscopic glass. One minute after the deposition, the surface was rinsed with distilled water. The sample was left to dry for 24 h. The images were collected in tapping mode of the AFM using standard cantilever Tap190Al-G (Nanosurf AG, Liestal, Switzerland) with a 10 nm tip radius. The resultant picture showed a 10 × 10 µm area from the sample surface with a viewing field of 256 × 256 pixels collected over a 0.7 s scan time.
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