A Digital Instrument Multimode SPM in the tapping mode with BRUKER RTESPA-300 tip was used for observing the surface topographies and the corresponding thickness of different exfoliated nanosheets,17 (link) deposited on a clean silicon substrate (1 × 1 cm2) by drop casting method. The images were taken at a resolution of 256 × 256 pixel, by scanning an area of 10 × 10 μm2 at a rate of 1.00 Hz. Besides that, the values of operation point, integral gain, and P gain were fixed at 0.153 V, 1500 and 0.001, respectively.
Rtespa 300 tip
Manufactured by Bruker
The RTESPA-300 tip is a component of Bruker's atomic force microscopy (AFM) system. It is designed to be used with the Dimension series AFM systems. The RTESPA-300 tip is a probe that is used to measure surface topography and other properties of samples at the nanoscale level.
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Lab products found in correlation
2 protocols using rtespa 300 tip
1
Nanosheets Surface Topography Characterization
2
Characterizing Cu-Trz Microcrystal Surface
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The surface topographies and the corresponding height profiles of different surfaces were collected in the ScanAsyst Mode with a BRUKER RTESPA-300 tip. The samples were prepared by diluting the Cu-Trz fine powders in ethanol to a concentration of 0.1 mg/mL, and then the milky suspension in the vial was centrifuged at a rate of 3000 r/min for 3 min. Keeping the tube still for a few minutes, the top suspension containing microcrystals was dipped on a preheated silicon wafer (0.8 × 0.8 cm2). After complete evaporation of the ethanol on the substrate, the as-prepared microcrystals were scanned at a rate of 1 Hz. The images were taken with a minimum resolution of 256 × 256 pixel2 (link).
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