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D2 phaser instrument

Manufactured by Bruker
Sourced in United States

The D2 Phaser is a compact and versatile X-ray diffractometer designed for a wide range of analytical applications. It features a high-performance X-ray source, advanced detector technology, and user-friendly software to provide reliable and accurate phase identification and quantification.

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8 protocols using d2 phaser instrument

1

Silver Nanoparticles X-Ray Diffraction

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The XRD pattern of the AgNPs was investigated using a Bruker D2 Phaser instrument with Cu κα 1.54 Å radiation. The XRD spectra were recorded in the range 2θ from 10.0 to 70.0 with a stepwise increment of 0.02° and a count time of 5 s.
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2

Characterization of Li-ion Battery Electrodes

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The cross‐section images of the electrodes were taken with a SEM (PhenomProX, Phenom World) using an accelerating voltage of 10 kV (electrode with CMC) and 15 kV (electrode with PVDF). Cross‐section images were generated by cutting one electrode with scissors and using special sample holders. Energy‐dispersive X‐ray spectroscopy (EDX) images were taken with the same device using an accelerating voltage of 15 kV. XRD was performed using a D2 Phaser instrument from Bruker. The measurement was conducted with a Cu X‐ray tube (30 kV, 10 mA) between 5° and 40°, using a step width of 0.05°. Air‐tight sample holders with a copper plate were used for the measurement. Electrodes for XRD were retrieved from coin cells that were cycled for 3½ cycles at 0.1 C, i.e., the measurement was stopped at a fully discharged state. Disassembling of the cells and XRD sample preparation took place inside an argon‐filled glovebox.
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3

Morphology and Thermal Analysis of ABAM Particles

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Scanning electron microscopy (SEM) and X-ray diffraction: the morphology of ABAM particles was assessed by using scanning electronic microscopy (SEM) images recorded on a Tabletop Microscope model TM-3000 (Hitachi Ltd., Tokyo, Japan) using 15 kV. The X-ray diffraction analysis was completed on a D2 Phaser instrument (Bruker Corporation, Billerica, MA, USA) using CuKα (λ = 1.54 Å) radiation with a Ni filter at a pitch of 0.02°, with 10 mA of current, at 30 kV, using a Lynxeye detector (Bruker Corporation, Billerica, MA, USA).
Thermal behavior: differential scanning calorimetry (DSC) measurements were carried out on a DSC Q20 cell (TA Instruments, New Castle, DE, USA) using a hermetically sealed aluminum crucible. About 4 mg of sample were used for all the experiments, under a dynamic nitrogen atmosphere (50 mL/min), at a heating rate of 10 °C/min in a temperature range of 25 to 500 °C. The temperature and heat flow of the DSC instrument were calibrated with indium (melting point = 157.5 °C and ∆H = 26.7 J/g). Thermogravimetry (TG) curves were obtained on a TGA-60H instrument (Shimadzu Corporation, Kyoto, Japan) using the similar conditions as for the DSC experiments, at an interval of 35 to 900 °C. The thermoanalytical data were analyzed by universal TA 2000 software.
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4

X-Ray Diffraction Measurement Protocol

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Measurements were performed on a Bruker D2Phaser instrument using CuKα radiation (λ = 1.54178 Å).
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5

Determination of Cellulose Crystallinity

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The powder X-ray diffraction patterns were measured at ambient temperature using Cu Kα radiation (λ = 0.15418 nm) over the 2θ range of 5° and 40° with a scanning speed of 1.2°/min. The instrument (Bruker, D2 Phaser instrument, Taiwan) was operated at 45 kV and 40 mA with a step size of 0.02°C. The crystallinity index (CI) of the samples was calculated by the following equation:
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$$Crystallinity \ index \left(\rm \% \right) = {{I_{002} - I_{am}} \over {I_{002}}} \times 100$$
\end{document}
I002 is the intensity value for the crystalline cellulose and Iam is the intensity value for the amorphous cellulose.
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6

Characterization of Spark Plasma Sintered BMG

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Samples were prepared using spark plasma sintering39 40 41 42 , described previously34 35 . Briefly, the samples were prepared by consolidating SAM2X5 metallic glass powders inside a graphite die that produces cylindrical samples with diameters of 19 mm. The model for the spark plasma sintering unit is the HP D25 from FCT Systeme. Sample SAM2X5-600 was heated to a temperature of 873 K (600 °C) with no hold time at temperature. Sample SAM2X5-630 was heated to a temperature of 903 K (630 °C) with no hold time at temperature. The heating rate from room temperature to the sintering temperature was 500 K/min for both types of samples.
All BMG samples were characterized for density using the Archimedean method using an Ohaus Solids Density Determination Kit, Vickers hardness on a Leco LM100 system using a 300 gram-force held for 10 seconds, X-ray diffraction on a Bruker D2 Phaser instrument using Cu Kα radiation, and longitudinal and shear sound speed measurements using ultrasonic transducers and the pulse-echo technique using an Olympus 38DI Plus Ultrasonic Thickness Gauge.
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7

Physicochemical Characterization of Materials

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A sonication bath (Digital Ultrasonic Cleaner PS-10A, Meizhou, China) was used during the development process. A Benchmark “my Fuge” mini centrifuge (Benchmark Scientific, Sayreville, NJ, USA). HPLC analysis was performed using an Agilent 1100 Liquid Chromatography series equipped with a quaternary pump (G1311A), degasser (G1322A), diode array detector (G1315B) and manual injector (G1328B) with a Phenomenex® Kinetex® column (2.6 μm C18, 100 Å, 150 × 4.6 mm i.d.). Samples were freeze-dried using a LABCONCO FreeZone® 6 Liter Benchtop Freeze-Dry system (Kansas City, MO, USA). A PerkinElmer Spectrum 100 FT-IR Spectrometer was used to record IR spectra and a TA DSC 250 instrument was used for thermal analysis. The material crystallinity was assessed using an XRD D8 Discover or D2 Phaser Instrument (Bruker, Billerica, MA, USA). A Zetasizer nano ZEN–3600 MAL1043132 from Malvern Instruments (Malvern, UK) was used to determine the particle size, polydispersity index and zeta potential of the materials. Particles’ shape was analyzed using a Zeiss Libra-120KV TEM instrument (Oberkochen, Germany). The elemental composition of the developed materials was evaluated by using an INCA PENTA FET coupled to VAGA TESCAM energy-dispersive X-ray spectroscopy (Brno, Czech Republic).
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8

Characterization of [MPPyr][DCA]/MIL-101(Cr) Composite

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The IL
loading in the composite was determined by a measurement for which
the IL/MOF composite was washed with acetone solvent to extract all
the IL present in the composite. The infrared (IR) analysis of the
composite was performed before and after washing the sample with acetone.
The washed [MPPyr][DCA]/MIL-101(Cr) composite was then dried in an
oven at 65 °C and weighed, and IL loading was determined. X-ray
diffraction (XRD) analysis of the as-received MIL-101(Cr) and its
composite with [MPPyr][DCA] was performed on a Bruker D2 Phaser instrument.
IR spectra of the samples were collected in transmittance mode at
a spectral resolution of 2 cm–1 in the range of
400 to 4000 cm–1 using a Bruker Vertex 80v spectrometer.
IR peaks were deconvoluted by employing Fityk software using the Voigt
function.37 (link) N2 adsorption isotherms
were measured at −196 °C, from 10–6 to
1 bar, by using a Micromeritics ASAP 2020 accelerated surface area
and porosity analyzer. Prior to these measurements, the as-received
MIL-101(Cr) and its composite with [MPPyr][DCA] were degassed at 150
°C under vacuum for 12 h. Scanning electron microscopy (SEM)
images of the samples were obtained by using a Zeiss Evo LS 15 electron
microscope. Thermogravimetric analysis (TGA) was done on a TA Instruments
Q500 analyzer. The details of these measurements can be found in our
previous report.38 (link)
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