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6 protocols using su8010

1

Multi-Analytical Characterization of Electrode Materials

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The morphology of the samples was characterized by a field emission scanning electron microscope (SEM, SU8010) and AFM (Bruker Dimension Icon). The elemental composition of the electrode was analyzed by XRD (Bruker D8 ADVANCE), energy dispersive X-ray spectroscopy (EDS, linked with SEM), and XPS (Thermo Scientific ESCALAB 250Xi) measurements. The H magnetic resonance imaging (NMR) spectroscopy is performed on a Bruker Avance NEO (400 MHz). The morphology evolution of Zn anode during the plating process was detected by the optical microscope (NIKON SMZ1270). Ionic conductivity of the electrolytes were tested using conductivity meter produced by Shanghai Shiyi Precision Instruments Co, ltd.).
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2

Characterizing PLGA Nanoparticle Morphology

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The morphology and size of dry PLGA-NPS and RSV-PLGA-NPS were measured by field emission scanning electron microscopy (SEM) (HITACHI, SU8010, Japan) and atomic force microscopy (AFM) (Bruker, Dimension Icon, USA). 0.2 mg of nanoparticles was dissolved in 1 ml of deionized water. Then a drop of suspension of PLGA-NPS or RSV-PLGA-NPs was placed on an alcohol-treated clean wafer and dried at room temperature.
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3

Comprehensive Characterization of Perovskite Thin Films

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X-ray diffraction (XRD) patterns were obtained by a Rigaku MiniFlex II X-ray diffractometer. The morphology of perovskite films was investigated by scanning electron microscopy (SEM, Hitachi SU8010) and atomic force microscopy (AFM, Bruker dimension icon). The AFM images with a resolution of 256 × 256 were scanned upon a range of 3 μm by 3 μm and 15 μm by 15 μm, respectively20 (link). For surface roughness, at least six samples were measured for each group and the average values were presented. The light absorbance spectra were acquired using an Agilent Cary 300 conc UV-vis spectrophotometer. Steady-state and time-resolved photoluminescence (PL) measurements were carried out using a time-resolved single-photon counting technology (Edinburgh FLS 980). The wavelength of exciting light was 507 nm with a pulse duration of 100 ps at frequencies between 1–10 MHz. Photoluminescence spectra were obtained at the wavelength range of 500 to 800 nm with 1 nm increment.
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4

Comprehensive Materials Characterization

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TEM (Hitachi H-800), SEM (Hitachi SU-8010), XRD (Bruker AXS D8 Focus), Avatar 370 FTIR (US Nicolet), VSM (HH-10, Nanjing Nanda Instrument Plant), and Z-2000 AAS (Hitachi) instruments were employed.
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5

Nanostructure Characterization by Advanced Techniques

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The phase analysis was conducted by X-ray diffraction (XRD) on a Bruker D8 Advance diffractometer employing Cu Kα irradiation with 40 kV and 50 mA. The observations of nanostructures and morphologies were conducted using a field-emission transmission electron microscope (STEM, Talos F200X G2) and a field-emission scanning electron microscope (SEM, SU8010), respectively. The elements of the samples were identified via energy dispersive X-ray spectroscopy (EDS), which was connected with STEM. The chemical composition was examined by X-ray photoelectron spectroscopy (XPS, VG Multilab 2000). The Brunauer–Emmett–Teller (BET) specific surface areas were determined through nitrogen adsorption isotherms at 373 K using a Micromeritics ASAP 2020 instrument and calculated from the linear part of the BET plot. FT-IR spectra were recorded on a Nexus-470 spectrometer. UV-vis diffuse reflection spectra (DRS) were measured on a spectrophotometer (Cary 5000).
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6

Characterization of Synthesized PHEMA

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The number-average molecular weight (Mn) and molecular weight distribution of the synthesized PHEMA were analyzed by Gel Permeation Chromatograph(GPC, Waters 1515) equipped with a refractive-index detector (Waters 2414) using HR column (7.8 × 300 mm). The FT-IR spectra measurements were performed on a Nicolet is 50 (Thermo Fisher Nicolet, United States) Fourier transform infrared spectrometer equipped with Thermo Nicolet corporation OMINIC 32 software. The 1H NMR spectrum of the PHEMA was performed via INOVA 400 MHz nuclear magnetic resonance instrument with DMSO-d6 as solvent and tetramethylsilane (TMS) as internal standard. Thermogravimetric analysis (TGA) was performed on a NETZSCH STA409PC instrument. The morphology of the GO and PHEMA/GO were characterized via a scanning electron microscopy (SEM, BRUKER SU8010) and transmission electron microscopy (TEM, JEOL JEM-1230, Japan). The CHI 660C electrochemical workstation (CH Instruments, Shanghai) with traditional three-electrode system was used to carried out the square wave voltammetry (SWV). While Ag/AgCl and platinum wire were used as reference and counter electrodes, glassy carbon electrode was used as a working electrode.
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