UV-vis/DRS for the as synthesized photocatalysts was obtained over the wavelength range of 265–850 nm on a PerkinElmer (λ-850+/Tungsten-Halogen) spectrophotometer. Powdered XRD analysis was conducted on an advanced XRD system (Bruker D2-phaser) equipped with a LYNXEYE XE-T Detector, 220 V/60 Hz. Using the Scherer equation, particle sizes were measured having D ≈ 0.9λ/(β cos θ); the Cu Kα operational X-ray source is (λ = 1.54 Å, 40 kV, 40 mA). The 2θ range was fixed from 15° to 80° (step: 0.05° and scan rate: 2° min−1), Fourier transform infrared (FT-IR) analysis was performed on a BrukerTensor-27. The SEM results were obtained using an FEI-Nova NanoSEM-450 electron microscope. The elemental composition of Co@Na–BiVO4 NPs was obtained using a SEM equipped with an energy dispersive X-ray (EDX) accessory. The AFM results were obtained using an Agilent 5500 SPM/AFM. The photoluminescence results were recorded on a spectrometer (LS-45, PerkinElmer). Photocatalytic dye degradation efficiencies were recorded using a UV/vis-spectrophotometer (PerkinElmer/λ-365).
Agilent 5500 spm afm
Manufactured by Agilent Technologies
The Agilent 5500 SPM/AFM is a scanning probe microscope that can image the surface of a sample at nanometer-scale resolution. It uses a sharp probe to scan the surface and measures the interactions between the probe and the sample, providing detailed information about the sample's topography and properties.
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2 protocols using agilent 5500 spm afm
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Comprehensive Physicochemical Characterization of Photocatalysts
2
Electrochemical and Spectroelectric Characterization
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All characterization was performed in PBS. The cyclic voltammograms were recorded using a potentiostat-galvanostat (PGSTAT128N, Autolab) with an Ag/AgCl reference electrode and a Pt counter electrode. The working electrode was P-90 cast on a Au-coated glass substrate. The system, in a closed chamber, was systematically degassed for at least 15 min in N2 before performing any measurements for characterization under inert atmosphere. The topography and the roughness of the polymer film and the enzyme adsorption were investigated using AFM and QCM-D. AFM measurements were performed in tapping contact mode with an Agilent 5500 SPM AFM in both air and liquid. QCM-D measurements were conducted using a Q-sense analyzer (QE401) on a bare Au sensor (as reference) and then on the Au sensor coated with the film. The data were treated with a viscoelastic model to calculate the mass of the enzyme adsorbed on the film (35 ). UV-VIS-NIR spectra were recorded using an Ocean Optics QE Pro Scientific grade spectrometer (185 to 1050 nm). For spectroelectrochemistry measurements, the spectrometer was coupled to a Keithley 2606A source measure unit, and when required, bias was applied between the polymer-coated ITO substrate, which serves as the working electrode and a Ag/AgCl reference electrode.
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