Ft ir 460 plus spectrometer with pressed kbr pellets

Elemental analyses of (C, H, N) were performed on a PE 2400 series II CHNS/O (PerkinElmer Instruments, Shelton, CT, USA) or an Elementar Vario EL III analyzer (Elementar Analysensysteme GmbH, Hanau, German). Infrared spectra were obtained from a JASCO FT/IR-460 Plus spectrometer with pressed KBr pellets (JASCO, Easton, MD, USA). Thermal gravimetric analyses (TGA) were carried out on an SII Nano Technology Inc. TG/DTA 6200 over the temperature range of 30 to 900 °C at a heating rate of 10 °C min⁻¹ under N₂ (SEIKO Instruments Inc., Chiba, Japan). UV–vis spectrum was performed on a UV-2450 spectrophotometer (Dongguan Hongcheng Optical Products Co., Dongguan, China). Emission spectra for the solid samples were determined with a Hitachi F-4500 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). Gas sorption measurements were conducted using a Micromeritics ASAP 2020 system (Micromeritics Instruments Co., Norcross, GA, USA). Powder X-ray diffraction patterns were carried out with a Bruker D8-Focus Bragg-Brentano X-ray powder diffractometer equipped with a CuKα sealed tube (λ_α = 1.54178 Å) at 40 kV and 40 mA (Bruker Corporation, Karlsruhe, Germany).

Elemental analyses of (C, H, N) were performed on a PE 2400 series II CHNS/O (PerkinElmer Instruments, Shelton, CT, USA) or an Elementar Vario EL-III analyzer (Elementar Analysensysteme GmbH, Hanau, Germany). Infrared spectra were obtained from a JASCO FT/IR-460 plus spectrometer with pressed KBr pellets (JASCO, Easton, MD, USA). Powder X-ray diffraction patterns were carried out with a Bruker D8-Focus Bragg–Brentano X-ray powder diffractometer equipped with a CuKα (λ_α = 1.54178 Å) sealed tube (Bruker Corporation, Karlsruhe, Germany). The UV-Vis spectrum was performed on a UV-2450 spectrophotometer (Dongguan Hongcheng Optical Products Co., Dongguan, China). Emission spectra were determined with a Hitachi F-4500 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). Energy dispersive X-ray (EDX) analysis was performed by using a JEOL JSM-7600F Ultra-High Resolution Schottky Field Emission Scanning Electron Microscope with Oxford Xmax80 energy dispersive X-ray spectrometer (JEOL, Ltd., Tokyo, Japan).