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18 protocols using asap 2460 analyzer

1

Structural and Compositional Analysis of Material

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N2 adsorption/desorption analysis was performed on a Micromeritics ASAP 2460 analyzer at −196 °C using nitrogen. Electron conductivity was measured on a semiconductor powder electron conductivity test board (Suzhou Jingle Electronic Co., Ltd., SZT-D) at ambient temperature using the four-contact method. Thermogravimetric analysis (TGA) was conducted on PerkinElmer Pyris Diamond TG/DTA thermal analyzer. The X-ray diffraction (XRD) was operated at 40 kV and 40 mA by a D/Max-IIIA Powder X-ray diffractometer and using Cu-Kα radiation (λ = 0.15406 nm). Raman spectra were recorded using a Renishaw inVia Raman spectrophotometer with a He–Ne laser excitation at 633 nm. The morphology of the samples was examined by a field emission environment scanning electron microscope (SEM, Quanta 400F) and transmission electron microscopy (TEM, FEI Tecnai G2 F30) with an acceleration voltage of 300 kV. An energy dispersive spectrometers (EDS) attached to the TEM apparatus was used for microscopic elemental analysis.
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2

Comprehensive Characterization of Carbon Nanomaterials

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X-ray diffraction (XRD) patterns of CN, CV and CVCs were tested on a Rigaku Smartlab diffractometer equipped with a Cu-Kα radiation source. Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images of CVCs were taken on a JEOL-2100F system. Fourier-transform infrared spectra (FTIR) of CN and CVCs were detected on a Nicolet NEXUS 470 spectrometer in the range of 4000–500 cm−1. Scanning electron microscopy (SEM) images, energy dispersion spectrum (EDS) and elemental mapping images of CVC-2 were characterized on a JSM-4800F scanning electron microscope. X-ray photoelectron spectroscopy (XPS) spectra of CN, CV and CVCs were obtained on a Thermo ESCALAB 250XI spectrometer equipped with an AlKα X-ray source. The BET specific surface area and N2 adsorption desorption isotherms of CN and CVCs were recorded on a Micromeritics ASAP 2460 analyzer at 77 K. The ultraviolet–visible diffuse reflectance spectra (DRS) of CN and CVCs were taken on a Shimadzu UV-2401 spectrophotometer equipped with an integrating sphere accessory.
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3

Adsorption Characteristics of Light Hydrocarbons on ZU-33

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ZU-33 was evacuated at 65 °C for 12 h until the pressure dropped below 7 µm Hg. The single-component adsorption isotherms of CH4, C2H2, C2H4, C2H6, C3H4, C3H4(PD), and C3H6 were collected at 298–308 K on activated ZU-33 using ASAP 2460 Analyzer (Micromeritics). The single-component adsorption isotherms of C4H6, n-C4H8, and i-C4H8 were collected at 298–308 K on activated ZU-33 using ASAP 2050 Analyzer (Micromeritics).
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4

Comprehensive Structural Analysis of Materials

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The crystal structure of the obtained products was identified by X-ray diffraction (XRD) pattern (Bruker D8 AVANCE X-ray diffractometer with Cu Kα). The morphologies and nanostructures were observed with field emission scanning electron microscopy (SEM, JSM-7500F) and transmission electron microscopy (TEM, JEM-2100F). X-ray photoelectron spectroscopy (XPS) was characterized by Thermo Escalab 250Xi X-ray photoelectron spectrometer to analyze the surface chemical compositions. The zeta potential was conducted on Malvern Zetasizer Nano ZS (Malvern Instruments, USA). Nitrogen adsorption/desorption isotherms and pore structures of as-obtained samples were carried out by a Micromeritics ASAP 2460 analyzer. Atomic force microscopy (AFM) image was investigated by Bruker Dimension ICON with Nanoscope V controller. To measure the EM parameters, resultant products were mixed with PVDF in different mass percentages to be pressed into circular rings (Φout = 7.00 mm and Φin = 3.04 mm). Subsequently, it was tested with coaxial line method by a vector network analyzer (VNA; Agilent TE5071C).
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5

Comprehensive Characterization of Samples

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The morphology and structure of the samples were characterized using scanning electron microscope (SEM, Hitachi S4800), transmission electron microscopy (TEM, Hitachi HT7700) and atomic force microscopy (AFM, Bruker edge). The XRD patterns of the samples were collected by using Bruker D8 Advanced XRD with Cu Kα radiation source. Raman spectra were obtained using a Raman spectrometer (Renishaw inVia Reflex with 633 nm laser excitation). XPS measurements were taken on a Thermo Fisher ESCALAB Xi+. The Zeta potential was conducted using a Zetasizer Nano ZSE apparatus. The specific surface area and porosity parameters were determined by the nitrogen sorption/desorption using a Micromeritics ASAP2460 analyzer.
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6

Characterization of Nanomaterials by Spectroscopy

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Transmission electron microscopy (TEM) images and TEM element mapping were characterized on a JEM-2100F (JEOL, Akishima, Japan). Scanning electron microscope (SEM) images and scanning electron microscopy in combination with energy-dispersive X-ray spectrometry (SEM/EDS) analysis were made by using scanning electron microscopy (SU-8010, Hitachi, Tokyo, Japan). An X-ray diffractometer (XRD) with Cu/Co radiation from D8 ADVANCE Germany (Bruker, Ettlingen, Germany) was used to identify the crystalline phase. X-ray photoelectron spectroscopy (XPS) was recorded by using a Thermo Scientific ESCALAB 250XI X-ray spectrometer (Waltham, MA, USA). The N2 adsorption/desorption experiment was measured with a Micromeritics ASAP 2460 analyzer (Norcross, GA, USA). A UV–vis spectrophotometer (T6 New Century, Beijing, China) was used for the detection of protein concentration, and a vortex mixer (VM-0003M, Labyeah, Shanghai, China) was used for the incubation of protein. Separation of the actual protein sample was performed by a sodium dodecyl sulfate-polyacrylamide gel (SDS-PAGE) electrophoresis apparatus (Bio-Rad, Hercules, CA, USA).
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7

Comprehensive Materials Characterization Protocol

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The crystal structures
were analyzed using a Germany Bruker D8 ADVANCE X-ray diffractometer
with Cu-Kα irradiation. Raman spectra were detected on a LabRAM
Aramis (France) with 532 nm laser. Scanning electron microscopy (SEM)
was conducted on a JEOL JSM 6700 F instrument. The morphologies were
investigated by the JEOL model JEM 2100 EX transmission electron microscope.
XPS spectra were analyzed on the Axis Ultra apparatus. The absorbance
was tested using a Hitachi U-3010 spectrophotometer using BaSO4 as the reference. The PL spectrum was identified through
an F-4500 fluorescence spectrophotometer excited with the wavelength
of 320 nm. The specific surface areas, nitrogen adsorption–desorption
isotherms, and pore size distribution were monitored via the Micromeritics ASAP2460 analyzer.
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8

Adsorption Characterization of Porous Materials

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ZU-72, SIFSIX-1-Cu, ZU-61 and zeolite 5A were evacuated for 12 h at 353 K, 338 K, and 473 K, respectively, until the pressure dropped below 7 µmHg. Nitrogen adsorption–desorption isotherms at 77 K were collected using ASAP 2460 Analyzer (Micromeritics). The single-component vapor adsorption isotherms of hexane isomers were collected at 298 K on activated samples using autosorb iQ/ASiQwin (Quantachrome Instruments) vapor adsorption analyzer. The single-component vapor adsorption isotherms of pentane and heptane isomers were collected on the BELsorp max II.
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9

Comprehensive Characterization of Advanced Materials

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X-ray diffraction (XRD) was performed using a Rigaku Smart Lab diffractometer (Cu-Kα radiation). Transmission electron microscopy (TEM) images were obtained on a Jem-2100F (Japan) instrument. Scanning electron microscopy (SEM) images and energy-dispersive spectroscopy (EDS) maps were recorded with a Hitachi S4800 (Tokyo, Japan). Fourier-transform infrared (FTIR) spectra were tested on a Nicolet iS50 FT-IR spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) in the wavenumber range of 400–4000 cm−1 using the KBr pelleting method. Thermogravimetric analysis (TGA) was performed on a Shimadzu DTG-60H simultaneous DTA-TG apparatus, under a nitrogen atmosphere from 30 to 800 °C. The nitrogen adsorption–desorption isotherms were analyzed by a Micromeritics ASAP 2460 analyzer. The magnetism of the samples was measured with a vibrating sample magnetometer (VSM, Quantum Design) at room temperature.
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10

Adsorption Isotherms of C2H2 and C2H4 on ZUL Activated Carbons

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ZUL-100, ZUL-200, ZUL-210 and ZUL-220 were evacuated at room temperature for 24 h until the pressure below 5 μmHg. The measurements of C2H2 and C2H4 adsorption isotherms on activated ZUL-100, ZUL-200, ZUL-210, and ZUL-220 were collected at 273–313 K using ASAP 2460 Analyzer (Micromeritics).
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