Jspm 4210

CNp size and geometry were analyzed by atomic force microscopy (AFM) with a scanning probe microscope (JSPM-4210, JEOL^®, Tokyo, Japan). In brief, the CNp dispersion was obtained after centrifugation, and the pellet resuspension was diluted to 1:100 with distilled water. A drop was placed on a coverslip, allowing it to dry at room temperature. The coverslip with the drop was held in place with carbon tape, and room-temperature conditions were utilized to assess the samples.

The crystallinity and structure of the ferrite were investigated by X-ray diffraction recorded at room temperature, using a D8 Advance (Bruker, Germany) diffractometer, operating at 40 kV and 40 mA with CuKα radiation (λ = 1.54060 Å).
The formation of ferrite and SiO₂ matrix was monitored using a Spectrum BX II (Perkin Elmer, Waltham, MA, USA) Fourier transform infrared spectrometer on pellets containing 1% sample in KBr.
AFM was performed by a JSPM 4210 (JEOL, Tokio, Japan) scanning probe microscope using NSC15 cantilevers (diamond-coated silicon nitride tips) with a resonant frequency of 325 kHz and a force constant of 40 N/m in tapping mode. The samples were dispersed into ultrapure water and transferred on glass slides by vertical adsorption for 30 s, followed by natural drying. Areas of 2.5 µm × 2.5 µm to 1 µm × 1 µm of dried glass slides were scanned for three different macroscopic sites.
A cryogen-free VSM magnetometer (Cryogenic Ltd., London, UK) was used for the magnetic measurements. The M_S was measured in a high magnetic field up to 10 T, while the magnetic hysteresis loops were performed between −2 and 2 T, at 300 K on samples incorporated in epoxy resin.

The zeta potential (ζ) was evaluated by microelectrophoresis, and the particle size was measured via dynamic light scattering utilizing a Zetasizer Nano ZS90 (Malvern Instruments, Worcestershire, UK). The nanoparticles were suspended in Milli-Q water and slightly agitated to spread them. The experiment was conducted in triplicate at 25 °C; and size results were expressed in nanometers (nm), and the ζ potential was expressed in millivolts (mV). The nanoparticle morphology was observed using atomic force microscopy (AFM, model JSPM-4210, JEOL, Tokyo, Japan) in noncontact mode using an NSC15 silicon cantilever (MikroMasch, Portland, OR, USA) and analyzed with WSxM software.