Jsm 7500f scanning

Manufactured by JEOL

Sourced in Japan

The JEOL JSM-7500F is a high-resolution scanning electron microscope (SEM) that provides detailed images and analysis of a wide range of samples. It utilizes a field emission electron gun to produce a high-brightness, small-diameter electron beam, enabling high-resolution imaging and precise analysis.

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Lab products found in correlation

Nano zs90, by Malvern Panalytical (1 mentions) Nicolet is10 fourier transform infrared ft ir spectrometer, by Thermo Fisher Scientific (1 mentions) 51 xmx0019x max energy dispersive x ray spectroscopy edxs, by Oxford Instruments (1 mentions) E 1010 ion sputter, by Hitachi (1 mentions)

Spelling variants of this product

JSM-7500F (462 citations) JSM-7500F scanning electron microscope (33 citations) JSM-7500F field emission scanning electron microscope (21 citations) JSM 7500F cold field emission scanning electron microscope (3 citations) JSM-7500F scanning microscope (2 citations) JSM-7500F scanning electron (2 citations)

3 protocols using jsm 7500f scanning

Characterization of Nanoparticles by DLS, TEM, and SEM

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The particle sizes were determined by a Malvern Zetasizer Nano ZS90 analyzer using the dynamic light scattering (DLS) technique. Transmission electron microscopy (TEM) images of nanoparticles were obtained using a Philips CM200 transmission electron microscope. Scanning electron microscopy (SEM) images of nanoparticles on ITO substrates were obtained using a JEOL JSM-7500F scanning electron microscope. The absorption and emission spectra were obtained by a Shimadzu UV-1800 spectrophotometer and a PTI QuantaMaster 40 spectrofluorometer, respectively.

Yoshioka N.A., Faraco T.A., Barud H.S., Ribeiro S.J., Cremona M., Fragneaud B., Maciel I.O., Quirino W.G, & Legnani C. (2022). Synthesis of Organic Semiconductor Nanoparticles with Different Conformations Using the Nanoprecipitation Method. Polymers, 14(24), 5336.

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Spectroscopic and Morphological Characterization

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FT-IR spectra were recorded by a Nicolet Is10 Fourier transform infrared spectrometer (FT-IR) (Thermo Fisher Scientific, USA) by the KBr pellet method in the range of 4000–400 cm⁻¹ with 2 cm⁻¹ of resolution. Surface morphology was observed using a JSM 7500F scanning electron microscopy (SEM) (JEOL, Japan). The elemental compositions of the samples were measured via 51-XMX0019 X-Max energy-dispersive X-ray spectroscopy (EDXS) (Oxford Instruments, UK).

Li J, & Cheng H. (2020). Ion-imprinted modified molecular sieves show the efficient selective adsorption of chromium(vi) from aqueous solutions. RSC Advances, 10(71), 43425-43431.

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Scanning Electron Microscopy of Baicalin-Andrographolide Composite

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Take a little baicalin, andrographolide, mixture, and composite on the sample stage with conductive glue fixing, and spray with gold-plated membrane by an E-1010 ion sputter (Hitachi, Japan). Then, the shape and surface morphology was observed with a JSM-7500F scanning electron microscopy (JEOL Ltd., Japan).

Han X., Zhang D.K., Zhang F., Lin J.Z., Jiang H., Lan Y., Xiong X., Han L., Yang M, & Fu C.M. (2017). A Novel Strategy for Bitter Taste Masking of Gankeshuangqing Dispersible Tablets Based on Particle Coating Technology. Pharmacognosy Magazine, 13(51), 400-406.

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