XPS (Kratos AXIS 165 electron spectrometer, Japan) was employed to acquire quantitative information on the chemical species of the surface. XPS spectra were recorded with a Kratos AXIS 165 electron spectrometer (Japan) using monochromated Al Kα X-ray irradiation generated at 350 ​W. The standard take-off angle used for analysis was 45°, which produced a maximum analysis depth in the range of 3–5 ​nm. Low-resolution survey spectra were recorded in 0.5 ​eV steps with a 187.85 ​eV analyzer pass energy from 0 to 1400 ​eV. SEM images of the samples were recorded using a scanning electron microscope (Philips XL-30, Holland). The surface topography of each sample was determined using a D3000 AFM microscope with a Nanoscope IV controller (Agilent PicoPlus). The scanning area was 1.5 ​× ​1.5 ​μm to determine roughness on the nanoscale. Root mean square (RMS) roughness values were obtained as Rq using the instrument software NanoScope Analysis.
Lai C., Zhang S.J., Chen X.C., Sheng L.Y., Qi T.W, & Yan L.P. (2021). Development of a cellulose-based prosthetic mesh for pelvic organ prolapse treatment: In vivo long-term evaluation in an ewe vagina model. Materials Today Bio, 12, 100172.
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