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Hl 2000 tungsten halogen light

Manufactured by OceanOptics

The HL-2000 tungsten halogen light is a compact and versatile light source from Ocean Optics. It provides stable broadband illumination in the 360-2400 nm wavelength range. The light source features a tungsten halogen lamp and can be operated using a USB connection or a power supply.

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4 protocols using hl 2000 tungsten halogen light

1

LSPR Sensor Chip Absorbance Measurement

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The LSPR sensor chip was illuminated by the light source (HL-2000 tungsten halogen light, Ocean Optics) that generates a continuous spectra of light from 400 to 700 nm. The incident light propagating along the illumination fiber embedded at the center of the light probe (R400-7-UV–vis, Ocean Optics) was introduced perpendicular to the sensing surface. The reflected light signal from the detection surface was collected by the detection fibers of the light probe, which was connected with a spectrometer (HR-4000, Ocean Optics) (Supporting 1). The absorbance spectrum of the detection surface was obtained using commercial signal processing software (Spectra Suits, Ocean Optics) that subtracts the measured intensity of the reflected light from the originally known intensity of the incident light at each wavelength over the spectral band of 400 to 700 nm. All the collected data were analyzed by a MATLAB code to obtain the regression curve and find the peak wavelength from the absorbance spectrum curve.
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2

Spectroscopic and Microscopic Analysis of Samples

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Absorbance spectra were collected using a USB 2000 + UV-Vis spectrometer with illumination from a HL-2000 Tungsten-Halogen light source guided through 200 μm optical fibers (Ocean Optics, Dunedin, FL). Mass spectra were acquired as an average of 60 laser shots using a Voyager-DE STR MALDI-TOF mass spectrometer (Applied Biosystems, Framingham, MA) operating in positive reflector mode at an accelerating voltage of 20 kV. Scanning electron microscopy (SEM) was performed on an FEI NNS450 SEM (Hillsboro, OR) in CFAMM at UC Riverside. For SEM analysis, all samples were sputtered with a Pt/Pd mixture for 30 s to enhance contrast and prevent titania sample charging. Atomic force microscopy was conducted on a Veeco Dimension 5000 (Santa Barbara, CA) under tapping mode at a scan rate of 1 Hz.
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3

LSPR Sensor Chip Absorbance Spectrum Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols
The LSPR sensor chip was illuminated by the light source (HL-2000 tungsten halogen light, Ocean Optics) that generates a continuous spectra of light from 400 to 700 nm. The incident light propagating along the illumination fiber embedded at the center of the light probe (R400-7-UV–vis, Ocean Optics) was introduced perpendicular to the sensing surface. The reflected light signal from the detection surface was collected by the detection fibers of the light probe, which was connected with a spectrometer (HR-4000, Ocean Optics) (Supporting 1). The absorbance spectrum of the detection surface was obtained using commercial signal processing software (Spectra Suits, Ocean Optics) that subtracts the measured intensity of the reflected light from the originally known intensity of the incident light at each wavelength over the spectral band of 400 to 700 nm. All the collected data were analyzed by a MATLAB code to obtain the regression curve and find the peak wavelength from the absorbance spectrum curve.
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4

Spectroscopic and Microscopic Analysis of Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
Absorbance spectra were collected using a USB 2000 + UV-Vis spectrometer with illumination from a HL-2000 Tungsten-Halogen light source guided through 200 μm optical fibers (Ocean Optics, Dunedin, FL). Mass spectra were acquired as an average of 60 laser shots using a Voyager-DE STR MALDI-TOF mass spectrometer (Applied Biosystems, Framingham, MA) operating in positive reflector mode at an accelerating voltage of 20 kV. Scanning electron microscopy (SEM) was performed on an FEI NNS450 SEM (Hillsboro, OR) in CFAMM at UC Riverside. For SEM analysis, all samples were sputtered with a Pt/Pd mixture for 30 s to enhance contrast and prevent titania sample charging. Atomic force microscopy was conducted on a Veeco Dimension 5000 (Santa Barbara, CA) under tapping mode at a scan rate of 1 Hz.
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