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Geminisem crossbeam 340 scanning electron microscope

Manufactured by Zeiss
Sourced in Germany

The Zeiss GeminiSEM Crossbeam 340 is a scanning electron microscope designed for high-resolution imaging and analysis of materials. It combines a field emission scanning electron microscope (FE-SEM) with a focused ion beam (FIB) column, enabling both imaging and sample preparation capabilities within a single system.

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2 protocols using geminisem crossbeam 340 scanning electron microscope

1

Elemental Composition Analysis of CNCs

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The change in the elemental composition of the CNCs after TDI-carbamation and the following surface grafting of the alcohols was determined using a ZEISS GeminiSEM Crossbeam 340 scanning electron microscope (ZEISS, Oberkochen, Germany), which was equipped with an X-MaxN EDX detector (Oxford Instruments, Abingdon, UK). The samples in the form of powder were pressed in a mold to obtain discs (diameter: 1 cm) of smooth surfaces. The measurements were performed using a voltage of 10 kV.
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2

Determining Degree of Substitution in CNCs

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Elemental analysis of solid samples of the CNCs at each stage of the process was conducted using a ZEISS GeminiSEM Crossbeam 340 scanning electron microscope (ZEISS, Oberkochen, Germany), equipped with an X-MaxN EDX detector (Oxford Instruments, Abingdon, UK) operating at a voltage of 10 kV. The samples in the powder form were pressed in a mold to obtain discs (diameter: 1 cm) of smooth surfaces. DSTDI was determined based on the increase in the nitrogen/carbon molar ratio (R) and the equation below, which was developed by the authors and published elsewhere [49 (link)]. To assure reproducibility, the measurement was performed in duplicate.
DSTDI=mmol TDImmol CNC Hydroxyls*100%=168,796.6 R427,737.8 R3+2270.4 R2+36.7 R+0.1
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