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46 protocols using jsm 5200

1

Characterization of Ag-doped Carbon Nanotubes

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SEM analysis (SEM; JSM-5200, JEOL, Tokyo, Japan) was performed for Ag-doped CNT and both untreated (control) and treated specimens with a working distance of 10 mm, magnification of 2000× and 5000×, resolution of 3 nm, and an accelerating voltage of 30 kV. An additional SEM micrograph was taken for the powder with the magnification 20,000×.
Chemical analysis for the powder and the specimens was carried out, employing an environmental scanning electron microscope (SEM; JSM-5200, JEOL, Tokyo, Japan) and energy-dispersive X-ray spectroscopy (EDX; Oxford Inca Energy 350, Oxford Instruments, Abingdon, UK), with a working distance of 10 mm, resolution of 3 nm, and an accelerating voltage of 30 kV. The automatic identification of elements and element quantification in both wt.% and atomic % were performed following the collection of EDX spectra. SEM images and associated EDX spectra were carefully recorded.
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2

SEM Imaging of Electrospun Fibers

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SEM imaging was performed with a JEOL JSM-5200 (Tokyo, Japan) scanning electron microscope at 1 kV acceleration voltage on uncoated samples. The SEM images were collected on neat, non-sputter-coated, samples, whereas the fiber sizes, d, were calculated based on 50 measurements on three SEM images taken at different parts of the samples. The open-source ImageJ (version 1.52a, National Institutes of Health, Bethesda, MD, USA) software was used to carry out the measurements. Since the generated fibers do not follow a normal distribution, instead of average size and standard deviation, box plots were used. These provide more accurate information regarding the distribution while also taking outliers into account. To quantify the fiber dimensions, the median values given by the box plots were used.
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3

Quantifying Glandular Trichomes in Artemisia annua

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For the determination of glandular trichome density from the upper epidermis of the leaf, a scanning electron microscope (SEM) was used (JEOL JSM-5200, Japan). The SEM was utilized in order to achieve small magnification, high contrast micrographs using secondary electrons at 20 mm working distance, with 1 of 5 kV accelerating voltage as function of sample charging. The fresh leaves of A. annua were collected at the full vegetation stage in July and were immediately subjected to analysis with the SEM. For the analysis 10 leaves of 10 randomly selected plants from each block were collected (a total of 80 plants sampled and 400 leaves/treatment analyzed). This represented almost completely the total upper leaves numbers of the plants. The youngest terminal leaf, of about 5 cm in length, on each plant was removed for sampling. The leaf surface was analyzed by starting with a fragment from the leaf mounted on a scanning surface in the form of a square with 0.6 cm sides (Figure 2). The number of glandular trichomes were counted with the multi-point tool, while the scanned leaf surface was measured with the polygon selection tool. Then the leaf surface was determined and the number of trichomes reported and averaged in mm2.
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4

Starch Granule Morphology Analysis

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The granule morphology of native, controls and treated starches was observed using a JSM 5200 scanning electron microscope (SEM) (JEOL, Tokyo, Japan). Samples were coated with gold in a vacuum evaporator (JEE 400, JEOL, Tokyo, Japan) prior to observation. The obtained samples were examined at an accelerating voltage of 10 kV and magnified 3,500x times.
The microstructure analysis was carried out using the image analysis program (ImageJ, UTHSCSA Image Tool software). The SEM images were saved as 8-bit tiff format.
Scale was initially set using the relationship between pixels and known distance.
Threshold was assessed applying the default algorithm and then particle analysis was carried out. The following parameters were measured: granule size and the pore size.
The area occupied by pores in a starch granule was calculated as the sum of the areas of all the pores of a starch granule divided by granule pore. Values were the average of 20 independent measurements.
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5

SEM Analysis of Specimen Preparation

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Two representative specimens per group were used for observational analysis under a scanning electron microscope (SEM). For this purpose, each specimen was fixed in a 2.5% glutaraldehyde 0.1 M cacodylate buffer for 3 h, and then dehydrated in ascending concentrations of ethanol (2 × 10 min of 50, 70, 80, 90, 95, and 100% ethanol). The ethanol was further slowly exchanged with HMDS, and the specimens were subsequently air-dried, gold–palladium-sputter-coated, and subjected to SEM analysis (JSM-5200, Jeol, Japan). The images obtained from the SEM evaluation are presented in Figure 2e–f.
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6

Characterization of Synthesized Materials

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The formed materials had been characterized by XRD (PANalytical
Empyrean, Sweden). The accelerating voltage used was 40 kV with a
current of 30 mA, a scan angle ranging from 5 to 60°, and a scan
step of 0.05. To determine the vibration of chemical bonds, a Bruker
Germany (Vertex 70 FTIR Raman) spectrophotometry (serial number 1341)
covering the frequency range of 400–4000 cm–1 had been applied using a potassium bromide disc. The morphology
of materials had been estimated by a scanning electron microscope
(SEM) (JEOL (JSM-5200), Japan). EDX was taken by a Quanta FEG250.
The stability of the suspensions of material was examined using zeta
potential on a Malvern (Malvern Instruments Ltd.) (Malvern Instruments
Ltd.).
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7

SEM Analysis of RT-NCs Morphology

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The surface morphology of RT-NCs was examined using scanning electron microscopy (SEM) (Jeol, JSM-5200, Tokyo, Japan). A sample of selected formulation (RT-NC2) was prepared by applying a droplet of RT-NCs onto an aluminum specimen stub, dried overnight, and sputter-coated with gold prior to imaging. An acceleration voltage of 15 kV was utilized.
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8

Granule Morphology Analysis of Starches

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The granule morphology of native and modified starches was observed using a JSM 5200 scanning electron microscope (SEM) (JEOL, Tokyo, Japan). Samples were examined at an accelerating voltage of 10 kV and magnified 2,000x times. The microstructure analysis was carried out using the methodology described by Benavent-Gil and Rosell [8] . The following parameters were measured: granule size and the pore area. The area occupied by pores in a starch granule (related to the abundance of pore per granule) was calculated as the sum of the areas of all the pores of a starch granule divided by granule area. Values were the average of 20 independent measurements.
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9

Scanning Electron Microscopy of PLGA Microspheres

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The morphology of PLGA microspheres was observed using a scanning electron microscope (model JSM-5200; Jeol Inc., Tokyo, Japan). Microspheres were sprinkled over double-sided adhesive tape attached to a cylinder specimen stub. This specimen stub was sputter-coated with platinum under vacuum in an argon atmosphere (model SC7620 sputter coater; VG Microtech, West Sussex, UK). The inside of the porous microspheres was observed through the following method. Scotch tape was applied to the above double-sided adhesive tape on which microsphere samples were dispersed. The tape composite was then lightly pressed, and the Scotch tape was detached. At this time, a part of the microsphere surface was peeled off. This procedure led to the exposure of the inside of the microspheres. This specimen stub was sputter-coated as described earlier.
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10

Scanning Electron Microscopy of Optimized Nanosuspension

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The surface morphology of an optimized nanosuspension of MA was evaluated using scanning electron microscopy (SEM) (JSM-5200, JEOL Inc., Tokyo, Japan). A very small drop of concentrated aqueous suspension of MA was placed on a glass slide and then quickly dried under vacuum conditions. The sample was then fixed on a SEM stub utilizing double-sided adhesive tape and coated with gold at 20 mA for 2 min using an Auto-fine Coater (Ion sputter JFC 1600, Tokyo, Japan). After coating, photomicrographs of the sample were taken using SEM with a secondary electron detector with an accelerating voltage of 10 kV. The sample was shadowed in a cathodic evaporator with a gold layer of 20 nm thickness [25] .
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