Chemical analysis for the powder and the specimens was carried out, employing an environmental scanning electron microscope (SEM; JSM-5200, JEOL, Tokyo, Japan) and energy-dispersive X-ray spectroscopy (EDX; Oxford Inca Energy 350, Oxford Instruments, Abingdon, UK), with a working distance of 10 mm, resolution of 3 nm, and an accelerating voltage of 30 kV. The automatic identification of elements and element quantification in both wt.% and atomic % were performed following the collection of EDX spectra. SEM images and associated EDX spectra were carefully recorded.
Jsm 5200
The JSM-5200 is a Scanning Electron Microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of samples. The JSM-5200 utilizes an electron beam to scan the surface of a specimen, producing detailed images that can reveal information about the sample's topography, composition, and other characteristics.
Lab products found in correlation
46 protocols using jsm 5200
Characterization of Ag-doped Carbon Nanotubes
Chemical analysis for the powder and the specimens was carried out, employing an environmental scanning electron microscope (SEM; JSM-5200, JEOL, Tokyo, Japan) and energy-dispersive X-ray spectroscopy (EDX; Oxford Inca Energy 350, Oxford Instruments, Abingdon, UK), with a working distance of 10 mm, resolution of 3 nm, and an accelerating voltage of 30 kV. The automatic identification of elements and element quantification in both wt.% and atomic % were performed following the collection of EDX spectra. SEM images and associated EDX spectra were carefully recorded.
SEM Imaging of Electrospun Fibers
Quantifying Glandular Trichomes in Artemisia annua
Starch Granule Morphology Analysis
The microstructure analysis was carried out using the image analysis program (ImageJ, UTHSCSA Image Tool software). The SEM images were saved as 8-bit tiff format.
Scale was initially set using the relationship between pixels and known distance.
Threshold was assessed applying the default algorithm and then particle analysis was carried out. The following parameters were measured: granule size and the pore size.
The area occupied by pores in a starch granule was calculated as the sum of the areas of all the pores of a starch granule divided by granule pore. Values were the average of 20 independent measurements.
SEM Analysis of Specimen Preparation
Characterization of Synthesized Materials
Empyrean, Sweden). The accelerating voltage used was 40 kV with a
current of 30 mA, a scan angle ranging from 5 to 60°, and a scan
step of 0.05. To determine the vibration of chemical bonds, a Bruker
Germany (Vertex 70 FTIR Raman) spectrophotometry (serial number 1341)
covering the frequency range of 400–4000 cm–1 had been applied using a potassium bromide disc. The morphology
of materials had been estimated by a scanning electron microscope
(SEM) (JEOL (JSM-5200), Japan). EDX was taken by a Quanta FEG250.
The stability of the suspensions of material was examined using zeta
potential on a Malvern (Malvern Instruments Ltd.) (Malvern Instruments
Ltd.).
SEM Analysis of RT-NCs Morphology
Granule Morphology Analysis of Starches
Scanning Electron Microscopy of PLGA Microspheres
Scanning Electron Microscopy of Optimized Nanosuspension
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